SCHEMBL705077

SCHEMBL705077

CCCC[Si](CCCC)(OCCC)c1ccc([Si](CCCC)(CCCC)OCCC)cc1

nearest known ligand 0.37

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
AR P10275 1/20 0.37
NR1H2 P55055 1/20 0.35
NR1H3 Q13133 1/20 0.35
CYP3A4 P08684 1/20 0.32
CYP2D6 P10635 1/20 0.32
LTA4H P09960 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL707158 0.92 AR (0.37) ARNR1H2NR1H3CYP3A4CYP2D6
SCHEMBL28062848 0.91 MGLL (0.35) ARNR1H2NR1H3CYP2D6
SCHEMBL28062938 0.91 SMN1; SMN2 (0.35) ARNR1H2NR1H3
SCHEMBL708788 0.90 LTA4H (0.39) CYP3A4CYP2D6LTA4H
SCHEMBL3481952 0.87 LTA4H (0.37) CYP3A4CYP2D6LTA4H
SCHEMBL705492 0.87 NR1H2 (0.33) NR1H2NR1H3
SCHEMBL712784 0.85 AR (0.38) ARNR1H2NR1H3
SCHEMBL17937674 0.83 SMN1; SMN2 (0.38) ARCYP3A4CYP2D6
SCHEMBL17937670 0.83 MGLL (0.38) ARNR1H2NR1H3CYP3A4CYP2D6
SCHEMBL3482212 0.83 LTA4H (0.37) CYP3A4CYP2D6LTA4H

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8124239-B2 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2012-02-28 US disclosed
US-20100155121-A1 SILICA FILM FORMING MATERIAL, SILICA FILM AND METHOD OF MANUFACTURING THE SAME, MULTILAYER WIRING STRUCTURE AND METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME FUJITSU LIMITED (JP) 2010-06-24 US disclosed
US-7659357-B2 Precursor organosilicon polymer of 1,2-Bis(dimethylethoxysilyl)ethane, 1,4-bis(dimethylethoxysilyl)benzene, tetraethoxysilane, methyltriethoxysilane, phenyltriethoxysilane; dielectric (DE) films having etching/chemical/moisture resistance; adhesion; low DE constant; minimal wiring delay; high speed FUJITSU LIMITED (JP) 2010-02-09 US disclosed
US-20070026689-A1 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2007-02-01 US disclosed