SCHEMBL7074581

SCHEMBL7074581

CCCCCC(C)=O.CCOC(=O)C(C)O

nearest known ligand 0.55

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
MAPT P10636 1/20 0.47
LMNA P02545 3/20 0.43
DGKA P23743 1/20 0.41
KDM4E B2RXH2 1/20 0.41
DUSP3 P51452 1/20 0.41
MEN1 O00255 1/20 0.41
KMT2A Q03164 1/20 0.41
FAAH O00519 2/20 0.40
CES2 O00748 1/20 0.40
CES1 P23141 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Ethyl Pyruvate SCHEMBL3043109 0.92 FAAH (0.42) MAPTLMNADGKAKDM4EDUSP3
SCHEMBL7192581 0.91 DGKA (0.42) MAPTLMNADGKAKDM4EDUSP3
Dodecane SCHEMBL10783340 0.86 MAPT (0.50) MAPTLMNADGKAKDM4EDUSP3
SCHEMBL27312400 0.85 MAPT (0.61) MAPTLMNADGKAKDM4EDUSP3
SCHEMBL28177287 0.85 MAPT (0.47) MAPTLMNADGKAKDM4EDUSP3
Hexanoate SCHEMBL28713510 0.85 AKR1B1 (0.59) MAPTLMNAMEN1KMT2A
SCHEMBL11672513 0.85 ALDH1A1 (0.37) MAPTLMNAKMT2A
SCHEMBL7193128 0.84 MAPT (0.39) MAPTLMNAKDM4EDUSP3MEN1
2-Dodecanone SCHEMBL10785903 0.84 MAPT (0.50) MAPTLMNADGKAKDM4EDUSP3
SCHEMBL15796093 0.84 MAPT (0.64) MAPTLMNADGKAKDM4EDUSP3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20030235778-A1 Photoresist compositions for short wavelength imaging SHIPLEY COMPANY, L.L.C. 2003-12-25 US disclosed
US-6596458-B1 Used in an ultramicrolithography process or another photofabrication process for the production of very large scale integrated circuits or high capacity microchips FUJI PHOTO FILM CO., LTD. (JP) 2003-07-22 US disclosed
EP-1324133-A1 Photoresist compositions for short wavelength imaging Shipley Co. L.L.C. (US) 2003-07-02 EP disclosed
US-6506535-B1 A positive working photoresist composition for use in the production of semiconductor integrated circuit devices, mask for the production of integrated circuits, printed wiring boards, liquid crystal panels FUJI PHOTO FILM CO., LTD. (JP) 2003-01-14 US disclosed
EP-0851880-B1 FRACTIONATION OF PHENOL FORMALDEHYDE CONDENSATE AND PHOTORESIST COMPOSITIONS PRODUCED THEREFROM CLARIANT FINANCE BVI LTD (VG) 2000-06-28 EP disclosed
EP-0851880-A1 FRACTIONATION OF PHENOL FORMALDEHYDE CONDENSATE AND PHOTORESIST COMPOSITIONS PRODUCED THEREFROM CLARIANT INTERNATIONAL LTD. (CH) 1998-07-08 EP disclosed
US-5693749-A DEIONIZATION VIA UNION AND CATION EXCHANGE RESINS, DESOLVENTIZING AND DEHYDRATION VIA DISTILLATION TO OBTAIN A HEAT RESISTANT NOVOLAC RESIN FORMED FROM M-CRESOL, P-CRESOL AND TRIOXANE HOECHST CELANESE CORPORATION (US) 1997-12-02 US disclosed
WO-1997011101-A1 FRACTIONATION OF PHENOL FORMALDEHYDE CONDENSATE AND PHOTORESIST COMPOSITIONS PRODUCED THEREFROM CLARIANT INTERNATIONAL, LTD. (CH) 1997-03-27 WO disclosed