SCHEMBL7204129

SCHEMBL7204129

CCC(=O)CS(OS(=O)(=O)C(F)(F)F)(C1CCCCC1)C1CCCCC1=O

nearest known ligand 0.33

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
MAPT P10636 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL984800 0.74 MAPT (0.39) MAPT
SCHEMBL642592 0.74 MAPT (0.41) MAPT
SCHEMBL515933 0.71 MAPT (0.43) MAPT
SCHEMBL8876738 0.70 MAPT (0.38) MAPT
SCHEMBL6550659 0.63 HSD11B1 (0.37)
SCHEMBL6549850 0.63 HSD11B1 (0.37)
Trifluoromethanesulfonic Acid SCHEMBL7204121 0.63 KMT2A (0.31)
SCHEMBL5972736 0.63 MAPT (0.33) MAPT
SCHEMBL7160160 0.62 HSD11B1 (0.32)
SCHEMBL7159781 0.62

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6602647-B2 Photo acid generator with high transparency and excellent heat stability in a photoresist for lithography using far ultraviolet light, especially light of ArF excimer consists of a cyclic sulfonium compound with 2-oxo group NEC CORPORATION (JP) 2003-08-05 US disclosed
US-20020045122-A1 Sulfonium salt compound and resist composition and pattern forming method using the same NEC CORPORATION 2002-04-18 US disclosed
EP-1113334-A1 Sulfonium salt compound, resist composition comprising the same and pattern forming method using the composition NEC CORPORATION (JP) 2001-07-04 EP disclosed