SCHEMBL7743404

SCHEMBL7743404

C[SiH](C)c1ccccc1CCCN

nearest known ligand 0.43

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
TAAR1 Q96RJ0 7/20 0.41
MAOA P21397 1/20 0.38
KIF11 P52732 2/20 0.35
TLR8 Q9NR97 1/20 0.35
HTR2A P28223 2/20 0.34
MPO P05164 1/20 0.34
SLC6A4 P31645 1/20 0.34
CHEK1 O14757 1/20 0.33
CYP2A6 P11509 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13714249 0.82 LIPG (0.44) TLR8
SCHEMBL4346247 0.80 FOLH1 (0.32)
SCHEMBL4533827 0.80 TAAR1 (0.41) TAAR1MAOAKIF11HTR2AMPO
SCHEMBL1931186 0.79 TAAR1 (0.42) TAAR1MAOAKIF11TLR8HTR2A
SCHEMBL4810563 0.79 PNMT (0.44) TAAR1SLC6A4CYP2A6
SCHEMBL4201232 0.78 LIPG (0.34)
SCHEMBL3678681 0.78 TAAR1 (0.50) TAAR1MAOAKIF11HTR2AMPO
SCHEMBL29943451 0.78 TAAR1 (0.50) TAAR1MAOAKIF11HTR2AMPO
SCHEMBL1069351 0.77 TAAR1 (0.36) TAAR1MAOAKIF11TLR8HTR2A
SCHEMBL1929389 0.74 MAOA (0.41) TAAR1MAOAKIF11TLR8MPO

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 31 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0929841-A4 METHOD FOR FORMING PHOTORESIST FEATURES HAVING REENTRANT PROFILES USING A BASIC AGENT MKE QUANTUM COMPONENTS COLORAD (US) 2001-04-18 EP claimed
US-5955244-A Method for forming photoresist features having reentrant profiles using a basic agent QUANTUM CORPORATION (US) 1999-09-21 US claimed
EP-0929841-A1 METHOD FOR FORMING PHOTORESIST FEATURES HAVING REENTRANT PROFILES USING A BASIC AGENT Mke-Quantum Components Colorado LLC (US) 1999-07-21 EP claimed
WO-1998008143-A1 METHOD FOR FORMING PHOTORESIST FEATURES HAVING REENTRANT PROFILES USING A BASIC AGENT MKE-QUANTUM COMPONENTS COLORADO LLC (US) 1998-02-26 WO claimed
CN-102558859-B Polyimide film made of multicomponent polyimide and process of producing the same UBE INDUSTRIES 2014-12-03 CN disclosed
CN-102375336-B Manufacturing method of photosensitive resin composition and solidified embossing pattern, and semiconductor device ASAHI KASEI E MATERIALS CORP 2013-10-09 CN disclosed
CN-103328543-A Modified silicone compound, and thermosetting resin composition, prepreg, laminate plate and printed wiring board using same HITACHI CHEMICAL CO LTD 2013-09-25 CN disclosed
CN-102162996-B Manufacture method for negative type photosensitive resin composition and cured relief pattern ASAHI KASEI E MATERIALS CORP 2013-07-17 CN disclosed
CN-102558859-A Polyimide film made of multicomponent polyimide and process of producing the same UBE INDUSTRIES 2012-07-11 CN disclosed
CN-101646960-B Optical member, optical system using the same, and method for manufacturing optical member CANON KK 2012-07-04 CN disclosed
CN-101809064-B Polyamide resin, photosensitive resin composition, method for forming cured relief pattern, and semiconductor device ASAHI KASEI E MATERIALS CORP 2012-06-13 CN disclosed
CN-101370892-B Polyimide resin composition and metal polyimide laminate ASAHI KASEI E MATERIALS CORP 2012-06-13 CN disclosed
CN-1805949-A Bis (fluorine-containing phthalic anhydride) and method for production thereof NIPPON CATALYTIC CHEM IND (JP) 2006-07-19 CN disclosed
CN-1668980-A Highly heat-resistant, negative-type photosensitive resin composition ASAHI CHEMICAL CORP (JP) 2005-09-14 CN disclosed
CN-1128384-C Liquid crystal aligning agent SUMITOMO BAKELITE CO (JP) 2003-11-19 CN disclosed
EP-0929841-A4 METHOD FOR FORMING PHOTORESIST FEATURES HAVING REENTRANT PROFILES USING A BASIC AGENT MKE QUANTUM COMPONENTS COLORAD (US) 2001-04-18 EP disclosed
CN-1257587-A Aligning agent for liquid crystal SUMITOMO BAKELITE CO (JP) 2000-06-21 CN disclosed
US-5955244-A Method for forming photoresist features having reentrant profiles using a basic agent QUANTUM CORPORATION (US) 1999-09-21 US disclosed
EP-0929841-A1 METHOD FOR FORMING PHOTORESIST FEATURES HAVING REENTRANT PROFILES USING A BASIC AGENT Mke-Quantum Components Colorado LLC (US) 1999-07-21 EP disclosed
WO-1998008143-A1 METHOD FOR FORMING PHOTORESIST FEATURES HAVING REENTRANT PROFILES USING A BASIC AGENT MKE-QUANTUM COMPONENTS COLORADO LLC (US) 1998-02-26 WO disclosed