SCHEMBL824318

SCHEMBL824318

C=C(C)C(=O)OC(CC)(CC)CC(=O)OCC

nearest known ligand 0.42

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
GAA P10253 2/20 0.42
MGAM O43451 1/20 0.42
SI P14410 1/20 0.42
MGAM2 Q2M2H8 1/20 0.42
THRB P10828 1/20 0.41
TSHR P16473 4/20 0.36
ALDH1A1 P00352 7/20 0.35
TRPA1 O75762 1/20 0.35
LMNA P02545 1/20 0.34
HSD17B10 Q99714 1/20 0.34
HSD11B1 P28845 1/20 0.33
GSK3A P49840 1/20 0.32
GSK3B P49841 1/20 0.32
GLO1 Q04760 1/20 0.32
CYP1A2 P05177 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL824315 0.84 HTT (0.33) THRBTSHRALDH1A1HSD17B10
SCHEMBL7023647 0.82 GAA (0.40) GAAMGAMSIMGAM2ALDH1A1
SCHEMBL827929 0.82 THRB (0.32) THRBTSHR
SCHEMBL278099 0.81 ALDH1A1 (0.44) THRBTSHRALDH1A1
SCHEMBL21023743 0.81 GAA (0.43) GAAMGAMSIMGAM2THRB
SCHEMBL13559183 0.78 GAA (0.41) GAAMGAMSIMGAM2THRB
SCHEMBL16291366 0.74 TSHR (0.40) THRBTSHRALDH1A1
SCHEMBL3817861 0.74 ALDH1A1 (0.38) THRBTSHRALDH1A1
SCHEMBL16291137 0.74 TSHR (0.40) THRBTSHRALDH1A1
SCHEMBL824359 0.74 GAA (0.39) GAAMGAMSIMGAM2ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8518629-B2 Resist composition for immersion exposure and method of forming resist pattern using the same TOKYO OHKA KOGYO CO., LTD. (JP) 2013-08-27 US disclosed
US-8518629-B2 Resist composition for immersion exposure and method of forming resist pattern using the same TOKYO OHKA KOGYO CO., LTD. (JP) 2013-08-27 US disclosed
US-8142979-B2 Resist composition for immersion exposure and method of forming resist pattern using the same Tokyo Ohka Tokyo Co., Ltd. (JP) 2012-03-27 US disclosed
US-8142979-B2 Resist composition for immersion exposure and method of forming resist pattern using the same Tokyo Ohka Tokyo Co., Ltd. (JP) 2012-03-27 US disclosed
US-20090311627-A1 Resist composition for immersion exposure and method of forming resist pattern using the same TOKYO OHKA KOGYO CO., LTD. 2009-12-17 US disclosed
US-20090311627-A1 Resist composition for immersion exposure and method of forming resist pattern using the same TOKYO OHKA KOGYO CO., LTD. 2009-12-17 US disclosed