SCHEMBL8370828

SCHEMBL8370828

CCCOCOc1cc(C(C)=O)cc(C(C)=O)c1

nearest known ligand 0.44

Predicted protein targets (top 17)

geneUniProtsupporting neighboursconfidence
L3MBTL1 Q9Y468 2/20 0.44
GAA P10253 1/20 0.43
PLA2G2A P14555 1/20 0.42
KMT2A Q03164 2/20 0.41
ALDH1A1 P00352 2/20 0.41
MAPT P10636 2/20 0.41
PLK1 P53350 1/20 0.39
CREBBP Q92793 2/20 0.39
BRD4 O60885 1/20 0.39
BRD2 P25440 1/20 0.39
MEN1 O00255 1/20 0.38
HPGD P15428 1/20 0.38
LMNA P02545 1/20 0.38
POLB P06746 1/20 0.38
NPSR1 Q6W5P4 1/20 0.38
MAOB P27338 1/20 0.36
SMN1; SMN2 Q16637 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL21110477 0.85 KMT2A (0.54) L3MBTL1GAAPLA2G2AKMT2AALDH1A1
SCHEMBL9702910 0.82 PLA2G2A (0.56) L3MBTL1GAAPLA2G2AKMT2AALDH1A1
SCHEMBL9970987 0.77 PLA2G2A (0.64) L3MBTL1GAAPLA2G2AALDH1A1MAPT
SCHEMBL25574855 0.76 ALDH1A1 (0.41) GAAPLA2G2AALDH1A1MAPT
SCHEMBL18531281 0.75 PLA2G4B (0.55) GAAKMT2AMAPTHPGDLMNA
SCHEMBL11387851 0.75 PLA2G2A (0.72) L3MBTL1GAAPLA2G2AKMT2A
SCHEMBL22779381 0.75 KAT6A (0.53) L3MBTL1GAAPLA2G2AKMT2AALDH1A1
SCHEMBL9679974 0.74 LMNA (0.42) L3MBTL1GAAPLA2G2AKMT2AALDH1A1
SCHEMBL10498963 0.74 PLA2G2A (0.75) L3MBTL1GAAPLA2G2A
SCHEMBL19565362 0.74 PLA2G2A (0.75) L3MBTL1GAAPLA2G2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0675410-B1 Resist composition for deep ultraviolet light WAKO PURE CHEM IND LTD (JP) 1999-08-04 EP disclosed
US-5780206-A USING AN ANTHRACENE DERIVATIVE AS AN ABSORBER ON HIGHLY REFLECTIVE SURFACES; ALKALI-SOLUBLE POLYMERS; GENERATION OF ACID CATALYSTS; FINE PATTERNS WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1998-07-14 US disclosed
US-5695910-A RESIN BECOMES ALKALI SOLUBLE BY ELIMINATING PROTECTIVE GROUPS BY ACTION OF IN SITU GENERATED ACID WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1997-12-09 US disclosed
EP-0579420-B1 Negative working resist material and pattern forming process WAKO PURE CHEM IND LTD (JP) 1997-03-05 EP disclosed
EP-0675410-A1 Resist composition for deep ultraviolet light WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1995-10-04 EP disclosed
US-5389491-A Negative working resist composition MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 1995-02-14 US disclosed
EP-0579420-A2 Negative working resist material and pattern forming process WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1994-01-19 EP disclosed