SCHEMBL84243

SCHEMBL84243

Oc1ccc(C(c2ccccc2)c2ccc(O)cc2O)c(O)c1

nearest known ligand 0.67

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
TYR P14679 1/20 0.67
ALOX5 P09917 2/20 0.47
ALDH1A1 P00352 1/20 0.42
GAA P10253 1/20 0.42
KMT2A Q03164 1/20 0.42
TDP1 Q9NUW8 1/20 0.42

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19806928 0.89 TYR (0.52) TYR
SCHEMBL19806864 0.89 TYR (0.54) TYRALOX5ALDH1A1GAAKMT2A
SCHEMBL9064707 0.87 TYR (0.50) TYRALDH1A1GAAKMT2ATDP1
SCHEMBL51791 0.83 TYR (0.52) TYRALOX5ALDH1A1GAAKMT2A
SCHEMBL19806923 0.83 TYR (0.47) TYRALOX5
SCHEMBL3793824 0.83 TYR (0.50) TYRALDH1A1GAAKMT2ATDP1
SCHEMBL28642768 0.82 TYR (0.52) TYR
SCHEMBL17703180 0.82 TYR (0.65) TYRALOX5GAAKMT2A
SCHEMBL11865275 0.82 TYR (0.65) TYRALOX5GAAKMT2A
SCHEMBL574310 0.80 TYR (0.62) TYRALOX5GAAKMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 23 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20210070683-A1 COMPOUND, RESIN, COMPOSITION, RESIST PATTERN FORMATION METHOD AND CIRCUIT PATTERN FORMATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2021-03-11 US disclosed
US-20210070685-A1 COMPOUND, RESIN, COMPOSITION, RESIST PATTERN FORMATION METHOD AND CIRCUIT PATTERN FORMATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2021-03-11 US disclosed
US-20210070727-A1 COMPOUND, RESIN, COMPOSITION AND PATTERN FORMATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2021-03-11 US disclosed
WO-2018016640-A1 COMPOUND, RESIN, COMPOSITION, RESIST PATTERN FORMATION METHOD, AND CIRCUIT PATTERN FORMATION METHOD 三菱瓦斯化学株式会社 2018-01-25 WO disclosed
EP-2181853-B1 Thermosensitive recording medium JUJO PAPER CO LTD (JP) 2015-09-23 EP disclosed
US-8492308-B2 Thermosensitive recording medium NIPPON PAPER INDUSTRIES CO., LTD. (JP) 2013-07-23 US disclosed
US-8129307-B2 Thermosensitive recording medium NIPPON PAPER INDUSTRIES CO., LTD. (JP) 2012-03-06 US disclosed
US-20110269622-A1 THERMOSENSITIVE RECORDING MEDIUM NIPPON PAPER INDUSTRIES CO., LTD. (JP) 2011-11-03 US disclosed
US-20110130281-A1 THERMOSENSITIVE RECORDING MEDIUM API CORPORATION 2011-06-02 US disclosed
EP-2261045-A1 HEAT-SENSITIVE RECORDING MEDIUM Nippon Paper Industries Co., Ltd. (JP) 2010-12-15 EP disclosed
US-20040241598-A1 Developer for thermal recording material and thermal recording materials NIPPON PAPER INDUSTRIES CO., LTD. (JP) 2004-12-02 US disclosed
EP-1437231-A1 DEVELOPER FOR THERMAL RECORDING MATERIAL AND THERMAL RECORDING MATERIALS API Corporation (JP) 2004-07-14 EP disclosed
EP-0725053-B1 Selected O-quinonediazide sulfonic acid esters of phenolic compounds and their use in radiation-sensitive compositions OLIN MICROELECTRONIC CHEM INC (US) 2000-04-05 EP disclosed
EP-0840170-B1 Selected O-quinonediazide sulfonic acid esters of phenolic compounds OLIN MICROELECTRONIC CHEM INC (US) 2000-04-05 EP disclosed
EP-0840170-A1 Selected O-quinonediazide sulfonic acid esters of phenolic compounds OCG MICROELECTRONIC MATERIALS, INC. (US) 1998-05-06 EP disclosed
US-5602260-A PHOTORESISTS OCG MICROELECTRONIC MATERIALS, INC. (US) 1997-02-11 US disclosed
US-5547814-A PHOTORESISTS OCG MICROELECTRONIC MATERIALS, INC. (US) 1996-08-20 US disclosed
EP-0725053-A1 Selected O-quinonediazide sulfonic acid esters of phenolic compounds and their use in radiation-sensitive compositions OCG MICROELECTRONIC MATERIALS, INC. (US) 1996-08-07 EP disclosed
US-5541033-A PHOTOSENSITIVE COMPOUNDS FOR POSITIVE PHOTORESISTS FORMING PATTERNS OCG MICROELECTRONIC MATERIALS, INC. (US) 1996-07-30 US disclosed
US-5153096-A Heat resistance, resolution, accuracy, for semiconductors FUJI PHOTO FILM CO., LTD. (JP) 1992-10-06 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20210070683-A1 COMPOUND, RESIN, COMPOSITION, RESIST PATTERN FORMATION METHOD AND CIRCUIT PATTERN FORMATION METHOD RER1, RTN4, FEM1B TYR 3769/4885ALOX5 205/4885ALDH1A1 2915/4885
US-20210070727-A1 COMPOUND, RESIN, COMPOSITION AND PATTERN FORMATION METHOD RDX, RTN4, CROCC TYR 3175/4885ALOX5 430/4885ALDH1A1 2692/4885
US-20210070685-A1 COMPOUND, RESIN, COMPOSITION, RESIST PATTERN FORMATION METHOD AND CIRCUIT PATTERN FORMATION METHOD RER1, RTN4, FEM1B TYR 3769/4885ALOX5 205/4885ALDH1A1 2915/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.