SCHEMBL85662

SCHEMBL85662

C=C(C)C(=O)OC(C)(C(F)(F)F)C12CC3CC(CC(C3)C1)C2

nearest known ligand 0.34

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
MEN1 O00255 1/20 0.33
MAPK1 P28482 1/20 0.33
KMT2A Q03164 1/20 0.33
CYP17A1 P05093 1/20 0.31
CYP19A1 P11511 1/20 0.31
EPHX2 P34913 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6103942 0.87 TGM2 (0.34) MEN1MAPK1KMT2ACYP17A1CYP19A1
SCHEMBL85658 0.83 ALDH1A1 (0.34) MEN1MAPK1KMT2AEPHX2
SCHEMBL15281488 0.81 CYP17A1 (0.36) MEN1MAPK1KMT2ACYP17A1CYP19A1
SCHEMBL677951 0.81 MEN1 (0.36) MEN1MAPK1KMT2ACYP17A1CYP19A1
SCHEMBL172055 0.81 CYP17A1 (0.36) MEN1MAPK1KMT2ACYP17A1CYP19A1
SCHEMBL1215028 0.77 MEN1 (0.33) MEN1MAPK1KMT2ACYP17A1CYP19A1
SCHEMBL24908658 0.76 ALDH1A1 (0.33) MEN1MAPK1KMT2ACYP17A1CYP19A1
SCHEMBL1143635 0.76 EPHX2 (0.35) MEN1MAPK1KMT2ACYP17A1CYP19A1
SCHEMBL17753844 0.75
SCHEMBL3680710 0.75 CYP17A1 (0.32) MEN1MAPK1KMT2ACYP17A1CYP19A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9760010-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-09-12 US disclosed
US-9760010-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-09-12 US disclosed
US-20160363866-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-12-15 US disclosed
US-20160363866-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-12-15 US disclosed
US-9201300-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-12-01 US disclosed
US-9201300-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-12-01 US disclosed
US-20140178818-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-06-26 US disclosed
US-20140178818-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-06-26 US disclosed
US-8129099-B2 Double patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-06 US disclosed
US-20090208886-A1 DOUBLE PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-08-20 US disclosed