SCHEMBL888446

SCHEMBL888446

CO[Si](NC1CCCCC1)(OC)OC

nearest known ligand 0.39

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.39
HSD17B10 Q99714 1/20 0.39
NPSR1 Q6W5P4 1/20 0.36
POLB P06746 1/20 0.34
EPHX2 P34913 2/20 0.33
SIGMAR1 Q99720 2/20 0.33
GLA P06280 1/20 0.32
EPHX1 P07099 4/20 0.32
NPC1 O15118 2/20 0.32
RAB9A P51151 2/20 0.32
SMN1; SMN2 Q16637 2/20 0.32
ADH1B P00325 1/20 0.32
ADH1C P00326 1/20 0.32
ADH1A P07327 1/20 0.32
ADH4 P08319 1/20 0.32
CA12 O43570 1/20 0.32
CA1 P00915 1/20 0.32
CA7 P43166 1/20 0.32
CA14 Q9ULX7 1/20 0.32
TP53 P04637 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL888279 0.97 ALDH1A1 (0.35) ALDH1A1HSD17B10NPSR1POLBEPHX2
SCHEMBL723852 0.80 ALDH1A1 (0.39) ALDH1A1HSD17B10NPSR1POLBEPHX2
SCHEMBL2999986 0.80 ALDH1A1 (0.39) ALDH1A1HSD17B10NPSR1POLBEPHX2
SCHEMBL11059965 0.78 ALDH1A1 (0.38) ALDH1A1HSD17B10NPSR1POLBEPHX2
SCHEMBL4210578 0.78 ALDH1A1 (0.38) ALDH1A1HSD17B10NPSR1POLBEPHX2
SCHEMBL4211760 0.77 ALDH1A1 (0.35) ALDH1A1HSD17B10NPSR1POLBEPHX2
SCHEMBL3010190 0.77 ALDH1A1 (0.35) ALDH1A1HSD17B10NPSR1POLBEPHX2
SCHEMBL4213117 0.75 ALDH1A1 (0.33) ALDH1A1HSD17B10NPSR1POLB
SCHEMBL4202092 0.75 NPSR1 (0.37) ALDH1A1HSD17B10NPSR1POLBEPHX2
SCHEMBL28995357 0.75 THRB (0.36) ALDH1A1HSD17B10NPSR1EPHX1NPC1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 37 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250285785-A1 DRY FILM FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. 2025-09-11 US disclosed
US-11721543-B2 Planarizing process and composition FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2023-08-08 US disclosed
US-20230053355-A1 Dry Film FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. 2023-02-23 US disclosed
CN-109789644-B Dielectric film forming composition 富士胶片电子材料美国有限公司 2023-01-31 CN disclosed
EP-4091000-A1 DRY FILM FUJIFILM Electronic Materials U.S.A, Inc. (US) 2022-11-23 EP disclosed
CN-115280188-A Dry film 富士胶片电子材料美国有限公司 2022-11-01 CN disclosed
EP-4041803-A1 PLANARIZING PROCESS AND COMPOSITION FUJIFILM Electronic Materials U.S.A., Inc. (US) 2022-08-17 EP disclosed
CN-114787240-A Planarization method and composition 富士胶片电子材料美国有限公司 2022-07-22 CN disclosed
CN-109790405-B Dielectric film forming composition 富士胶片电子材料美国有限公司 2022-07-15 CN disclosed
WO-2021067547-A1 PLANARIZING PROCESS AND COMPOSITION FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2021-04-08 WO disclosed
US-8367310-B2 Pattern forming process and resist-modifying composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-02-05 US disclosed
US-8329384-B2 Resist-modifying composition and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-12-11 US disclosed
US-20110269926-A1 SOLID CATALYST COMPONENT FOR OLEFIN POLYMERIZATION, MANUFACTURING METHOD, AND CATALYST AND OLEFIN POLYMER MANUFACTURING METHOD TOHO TITANIUM CO., LTD. (JP) 2011-11-03 US disclosed
EP-2374821-A1 SOLID CATALYST COMPONENT FOR OLEFIN POLYMERIZATION, MANUFACTURING METHOD, AND CATALYST AND OLEFIN POLYMER MANUFACTURING METHOD Toho Titanium CO., LTD. (JP) 2011-10-12 EP disclosed
US-20110033799-A1 PATTERN FORMING PROCESS, CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION, AND RESIST-MODIFYING COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-02-10 US disclosed
US-20100297554-A1 RESIST-MODIFYING COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-25 US disclosed
US-20100297563-A1 RESIST-MODIFYING COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-25 US disclosed
US-20100209849-A1 PATTERN FORMING PROCESS AND RESIST-MODIFYING COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-08-19 US disclosed
US-20100159392-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-24 US disclosed
US-20100086878-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-04-08 US disclosed