SCHEMBL950714

SCHEMBL950714

COCCOCOCCC1CNCCO1

nearest known ligand 0.40

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
ADRA2C P18825 1/20 0.40
SLC6A4 P31645 8/20 0.37
SLC6A2 P23975 6/20 0.37
SLC6A3 Q01959 4/20 0.37
HTR2A P28223 3/20 0.37
ADRB2 P07550 1/20 0.37
HTR1A P08908 1/20 0.37
ADRA1A P35348 1/20 0.37
HTR2B P41595 1/20 0.37
REN P00797 3/20 0.33
EPHA2 P29317 1/20 0.32
MKNK1 Q9BUB5 1/20 0.32
CHEK1 O14757 3/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL599223 0.94 ADRA2C (0.41) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A
SCHEMBL597741 0.94 ADRA2C (0.41) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A
SCHEMBL8510441 0.87 ADRA2C (0.45) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A
SCHEMBL6008849 0.83 SLC6A2 (0.41) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A
SCHEMBL10330624 0.80 SLC6A2 (0.47) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A
SCHEMBL596661 0.78 SMN1; SMN2 (0.42) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A
SCHEMBL597657 0.78 SMN1; SMN2 (0.42) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A
SCHEMBL27767545 0.78 ADRA2C (0.41) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A
SCHEMBL2893125 0.76 SLC6A2 (0.36) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A
SCHEMBL2892626 0.76 SLC6A2 (0.36) ADRA2CSLC6A4SLC6A2SLC6A3HTR2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 29 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2100887-B1 Lactone-containing compound, polymer, resist composition, and patterning process SHINETSU CHEMICAL CO (JP) 2013-07-03 EP disclosed
EP-1829850-B1 Method for the preparation of fluorinated monomers SHINETSU CHEMICAL CO (JP) 2012-05-16 EP disclosed
US-8062831-B2 Carboxyl-containing lactone compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-11-22 US disclosed
US-7871752-B2 Lactone-containing compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-01-18 US disclosed
US-7868199-B2 fluoro (meth)acrylate or unsaturated polycyclic ester monomer as radiation-sensitive resist compositions; good development characteristics; high resolution and an anti-swelling effect; low cost production; precise micropatterning EUDYNA DEVICES INC. (JP) 2011-01-11 US disclosed
EP-2070901-B1 Fluoroalcohol preparation method, fluorinated monomer, polymer, resist composition and patterning process SHINETSU CHEMICAL CO (JP) 2010-12-22 EP disclosed
US-7833694-B2 Lactone-containing compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-16 US disclosed
US-7771913-B2 Resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-08-10 US disclosed
US-7771914-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-08-10 US disclosed
US-7678530-B2 Lactone-containing compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-03-16 US disclosed
US-20090081588-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-03-26 US disclosed
US-20080090172-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-04-17 US disclosed
US-20080026331-A1 Lactone-containing compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2008-01-31 US disclosed
US-20080008961-A1 POSITIVE RESIST COMPOSITIONS AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-01-10 US disclosed
US-20070231738-A1 Resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-10-04 US disclosed
US-20070231741-A1 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-10-04 US disclosed
EP-1829850-A2 Fluoroalcohol preparation method, fluorinated monomer, polymer, resist composition and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2007-09-05 EP disclosed
US-20070179309-A1 fluoro (meth)acrylate or unsaturated polycyclic ester monomer as radiation-sensitive resist compositions; good development characteristics; high resolution and an anti-swelling effect; low cost production; precise micropatterning SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-08-02 US disclosed
US-20070160929-A1 photoresists; photomasks; heat treatment; high resolution and prevent dissolution in water and penetration of water when processed by immersion lithography SHIN-ETSU CHEMICAL CO., LTD. 2007-07-12 US disclosed
US-20060093960-A1 Fluorinated monomer having cyclic structure, manufacturing method, polymer, photoresist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2006-05-04 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20070179309-A1 fluoro (meth)acrylate or unsaturated polycyclic ester monomer as radiation-sensitive resist compositions; good development characteristics; high resolution and an anti-swelling effect; low cost production; precise micropatterning AFF1, FASN, FAR1 ADRA2C 3374/4885SLC6A4 4651/4885SLC6A2 4649/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.