SCHEMBL986920

SCHEMBL986920

COC(C)(C)CCCCCC(=O)O

nearest known ligand 0.52

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 3/20 0.52
TSHR P16473 6/20 0.50
LMNA P02545 2/20 0.50
NFKB1 P19838 1/20 0.50
PMP22 Q01453 1/20 0.50
GPR84 Q9NQS5 8/20 0.46
PPARG P37231 7/20 0.46
PPARD Q03181 7/20 0.46
PPARA Q07869 7/20 0.46
HDAC11 Q96DB2 5/20 0.46
PTPN1 P18031 3/20 0.46
TDP1 Q9NUW8 3/20 0.46
TLR2 O60603 2/20 0.46
FABP4 P15090 2/20 0.46
FFAR1 O14842 2/20 0.46
SLC22A6 Q4U2R8 1/20 0.46
SLC22A8 Q8TCC7 1/20 0.46
MEN1 O00255 1/20 0.46
ESR1 P03372 1/20 0.46
ALOX15 P16050 1/20 0.46

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL157395 0.98 ALDH1A1 (0.48) ALDH1A1TSHRLMNANFKB1PMP22
SCHEMBL984967 0.91 TSHR (0.46) ALDH1A1TSHRLMNANFKB1PMP22
SCHEMBL12410508 0.82 NAALAD2 (0.43) ALDH1A1TSHRLMNANFKB1PMP22
SCHEMBL21933577 0.81 ALDH1A1 (0.41) ALDH1A1TSHRLMNANFKB1PMP22
SCHEMBL19333419 0.80 TSHR (0.46) ALDH1A1TSHRLMNANFKB1PMP22
SCHEMBL30955715 0.80 AKR1B1 (0.41) ALDH1A1TSHRGPR84PPARGPPARD
SCHEMBL10260231 0.80 ACLY (0.49) TSHRPPARGPPARATDP1FFAR1
SCHEMBL12141711 0.79 ALDH1A1 (0.47) ALDH1A1TSHRLMNANFKB1PMP22
SCHEMBL25307961 0.78 TSHR (0.60) ALDH1A1TSHRLMNANFKB1PMP22
SCHEMBL2832841 0.78 TSHR (0.60) ALDH1A1TSHRLMNANFKB1PMP22

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 150 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4621487-A1 RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING CURCUMIN DERIVATIVE Nissan Chemical Corporation (JP) 2025-09-24 EP disclosed
US-20250109242-A1 COMPOSITION FOR FORMING RESIST UNDERLAYER FILM CONTAINING HYDROXYCINNAMIC ACID DERIVATIVE NISSAN CHEMICAL CORPORATION (JP) 2025-04-03 US disclosed
WO-2024009993-A1 METHOD OF MANUFACTURING LAMINATE AND METHOD OF MANUFACTURING SEMICONDUCTOR ELEMENT 日産化学株式会社 2024-01-11 WO disclosed
CN-116547343-A Composition for forming silicon-containing resist underlayer film 日产化学株式会社 2023-08-04 CN disclosed
CN-116547781-A Composition for forming resist underlayer film 日产化学株式会社 2023-08-04 CN disclosed
CN-110850682-B Positive photosensitive resin composition, insulating film, and image display device 东友精细化工有限公司 2023-06-20 CN disclosed
US-11681222-B2 Fluorine-containing polymer, purification method, and radiation-sensitive resin composition JSR CORPORATION (JP) 2023-06-20 US disclosed
WO-2023074777-A1 ADDITIVE-CONTAINING COMPOSITION FOR FORMING SILICON-CONTAINING RESIST UNDERLAYER FILM 日産化学株式会社 2023-05-04 WO disclosed
WO-2022138863-A1 COMPOSITION FOR FORMING GAS BARRIER FILM, GAS BARRIER FILM AND METHOD FOR PRODUCING SAME 日産化学株式会社 2022-06-30 WO disclosed
US-20220137508-A9 FLUORINE-CONTAINING POLYMER, PURIFICATION METHOD, AND RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2022-05-05 US disclosed
EP-1164434-A2 Radiation-sensitive resin composition JSR Corporation (JP) 2001-12-19 EP disclosed
EP-1162506-A1 Radiation-sensitive resin composition JSR Corporation (JP) 2001-12-12 EP disclosed
US-20010041769-A1 Polysiloxane, method of manufacturing same, silicon-containingalicyclic compouns, and radiation-sensitive resin composition JSR CORPORATION (JP) 2001-11-15 US disclosed
EP-1142928-A1 Polysiloxane, method of manufacturing same, silicon-containing alicyclic compound, and radiation-sensitive resin compounds JSR Corporation (JP) 2001-10-10 EP disclosed
EP-0634696-B2 Chemically amplified resist composition JAPAN SYNTHETIC RUBBER CO LTD (JP) 2001-01-31 EP disclosed
US-6114086-A COMPRISING ALKALI-SOLUBLE RESIN, DISSOLUTION CONTROLLING AGENTS, PHOTOACID GENERATOR, SOLVENT; USED FOR THE MANUFACTURE OF SEMICONDUCTOR DEVICES OR INTEGRATED CIRCUITS JSR CORPORATION (JP) 2000-09-05 US disclosed
US-5916729-A A POSITIVE TONE TYPE REISTS CONSISTS OF A RESIN WHICH HAS AN ACIDIC FUNCTIONAL GROUP PROTECTED BY AN ACID DECOMPOSABLE GROUP AND IS HYDROLYZABLE, A PHOTOACID GENERATOR AND A SOLVENT MIXTURE OF ALKYL LACTATE WITH PROPYLENE GLYCOL ETHER JSR CORPORATION (JP) 1999-06-29 US disclosed
EP-0634696-B1 Chemically amplified resist composition JAPAN SYNTHETIC RUBBER CO LTD (JP) 1998-01-14 EP disclosed
US-5629135-A ALKALI-SOLUBLE RESIN, CROSSLINKER, PHOTOACID GENERATOR, SOLVENT JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1997-05-13 US disclosed
EP-0634696-A1 Chemically amplified resist composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1995-01-18 EP disclosed