Adipic Acid

Adipic Acid

SCHEMBL106658

C[N+](C)(C)C.O=C([O-])CCCCC(=O)O

nearest known ligand 0.55

Full drug profile on Sugi Atlas →

Known targets — ChEMBL curated mechanism

SLC18A2SLC6A2SLC6A3

The experimentally established mechanism targets of Adipic Acid. The predicted profile below is derived independently by chemical similarity — agreement is a validation signal, a miss is honest.

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
LMNA P02545 2/20 0.55
TSHR P16473 5/20 0.52
NFKB1 P19838 1/20 0.52
PMP22 Q01453 1/20 0.52
BBOX1 O75936 3/20 0.50
AKR1B1 P15121 1/20 0.50
PPARG P37231 6/20 0.48
PPARD Q03181 6/20 0.48
PPARA Q07869 6/20 0.48
HDAC11 Q96DB2 5/20 0.48
GPR84 Q9NQS5 4/20 0.48
ALDH1A1 P00352 2/20 0.48
TLR2 O60603 2/20 0.48
TDP1 Q9NUW8 2/20 0.48
FABP4 P15090 2/20 0.48
PTPN1 P18031 2/20 0.48
SLC22A6 Q4U2R8 1/20 0.48
SLC22A8 Q8TCC7 1/20 0.48
MEN1 O00255 1/20 0.48
ESR1 P03372 1/20 0.48

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Sebacic Acid SCHEMBL5874508 0.98 TSHR (0.57) LMNATSHRNFKB1PMP22BBOX1
Glutarate SCHEMBL104190 0.95 SLC22A6 (0.55) LMNATSHRNFKB1PMP22BBOX1
Adipic Acid SCHEMBL106656 0.89 BBOX1 (0.58) BBOX1FABP3CA1
Adipic Acid SCHEMBL105952 0.87 LMNA (0.65) LMNATSHRNFKB1PMP22AKR1B1
Tetramethylammonium Ion SCHEMBL8438225 0.87 BBOX1 (0.56) BBOX1FABP3CA1
Adipic Acid SCHEMBL105192 0.87 LMNA (0.65) LMNATSHRNFKB1PMP22AKR1B1
Adipic Acid SCHEMBL8028995 0.87 BBOX1 (0.56) BBOX1FABP3CA1
Adipic Acid SCHEMBL21489542 0.87 LMNA (0.65) LMNATSHRNFKB1PMP22AKR1B1
Adipic Acid SCHEMBL30776749 0.87 LMNA (0.65) LMNATSHRNFKB1PMP22AKR1B1
Sebacic Acid SCHEMBL5874500 0.87 BBOX1 (0.56) BBOX1FABP3CA1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 47 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-4885115-A Liquid electrolyte for use in electrolytic capacitor NIPPON CHEMI-CON CORPORATION (JP) 1989-12-05 US claimed
EP-2426558-B1 Silicon-containing film-forming composition, silicon-containing film-formed substrate, and patterning process SHINETSU CHEMICAL CO (JP) 2018-10-24 EP disclosed
EP-2500775-B1 PATTERNING PROCESS AND COMPOSITION FOR FORMING SILICON-CONTAINING FILM USABLE THEREFOR SHINETSU CHEMICAL CO (JP) 2018-01-03 EP disclosed
US-8951711-B2 Patterning process and composition for forming silicon-containing film usable therefor SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-02-10 US disclosed
US-20140342289-A1 PATTERNING PROCESS AND COMPOSITION FOR FORMING SILICON-CONTAINING FILM USABLE THEREFOR SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-20 US disclosed
US-8852844-B2 Composition for forming silicon-containing film, silicon-containing film-formed substrate and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-10-07 US disclosed
US-8835102-B2 Patterning process and composition for forming silicon-containing film usable therefor SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-16 US disclosed
EP-2172807-B1 Composition for forming silicon-containing film, silicon-containing film-formed substrate and patterning process SHINETSU CHEMICAL CO (JP) 2014-06-18 EP disclosed
EP-2172808-B1 Metal oxide-containing film-forming composition metal oxide-containing film-formed substrate, and patterning process SHINETSU CHEMICAL CO (JP) 2014-06-04 EP disclosed
US-8652267-B2 Coated-type silicon-containing film stripping process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-18 US disclosed
US-20080026322-A1 Hydrolytic condensation of organosilicon compound using acid and basic catalyst with Group 1a hydroxide, organic acid and solvent; efficiency patterning photoresist film SHIN-ETSU CHEMICAL CO., LTD. 2008-01-31 US disclosed
EP-1867681-A1 Silicon-containing film-forming composition, silicon-containing film, silicon-containing film-bearing substrate, and patterning method Shin-Etsu Chemical Co., Ltd. (JP) 2007-12-19 EP disclosed
EP-1845132-A2 Silicon-containing film-forming composition, silicon-containing film, silicon-containing film-bearing substrate, and patterning method Shinetsu Chemical Co., Ltd. (JP) 2007-10-17 EP disclosed
US-20070238300-A1 Silicon-containing film-forming composition, silicon-containing film, silicon-containing film-bearing substrate, and patterning method SHIN-ETSU CHEMICAL CO., LTD. 2007-10-11 US disclosed
US-7128976-B2 Composition for film formation, method of film formation, and silica-based film JSR CORPORATION (JP) 2006-10-31 US disclosed
US-20030091838-A1 Composition for film formation, method of film formation, and silica-based film JSR CORPORATION (JP) 2003-05-15 US disclosed
EP-0684619-B1 Ion-conductive polymer electrolyte and electrolytic capacitor using the same MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (JP) 2000-03-08 EP disclosed
US-4885115-A Liquid electrolyte for use in electrolytic capacitor NIPPON CHEMI-CON CORPORATION (JP) 1989-12-05 US disclosed
US-4734821-A AMMONIUM SALT OF CARBOXYLIC ACID ASAHI GLASS COMPANY LTD. (JP) 1988-03-29 US disclosed
US-4255553-A COMPRISING A COMPOUND HAVING AT LEAST TWO EPOXY GROUPS, A POLYESTER OR ACRYLIC RESIN, AND A QUARTERNARY AMMONIUM CARBOXYLATE AS CATALYST TOYO BOSEKI KABUSHIKI KAISHA (JP) 1981-03-10 US disclosed