SCHEMBL106786

SCHEMBL106786

CCCCOC(OCCCC)(C(=O)[O-])C(=O)C(CC)CC.CCCCOC(OCCCC)(C(=O)[O-])C(=O)C(CC)CC.CCCCOC(OCCCC)(C(=O)[O-])C(=O)C(CC)CC.CCCCOC(OCCCC)(C(=O)[O-])C(=O)C(CC)CC.[Ti+4]

nearest known ligand 0.41

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
CA2 P00918 9/20 0.41
CA1 P00915 6/20 0.36
MAPK1 P28482 1/20 0.35
ALDH1A1 P00352 1/20 0.33
ATM Q13315 1/20 0.32
CYP3A4 P08684 1/20 0.31
TSHR P16473 1/20 0.31
NFKB1 P19838 1/20 0.31
NPSR1 Q6W5P4 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL106127 0.97 CA2 (0.41) CA2CA1MAPK1ALDH1A1ATM
SCHEMBL1942207 0.97 CA2 (0.41) CA2CA1MAPK1ALDH1A1ATM
SCHEMBL107363 0.90 CA2 (0.35) CA2CA1CYP3A4TSHRNFKB1
SCHEMBL105557 0.86 CA2 (0.35) CA2CA1CYP3A4TSHRNFKB1
SCHEMBL109540 0.83 CA2 (0.31) CA2ALDH1A1
SCHEMBL106374 0.80 CA2 (0.31) CA2ALDH1A1
SCHEMBL939519 0.78 CA2 (0.39) CA2CA1MAPK1ALDH1A1ATM
SCHEMBL2383658 0.76 CA1 (0.36) CA1ALDH1A1ATM
SCHEMBL10935669 0.75 ALDH1A1 (0.42) CA1ALDH1A1ATMTSHR
SCHEMBL2454759 0.74 CA2 (0.32) CA2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 50 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-02-12 US disclosed
EP-4692941-A2 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2026-02-11 EP disclosed
US-20230408922-A1 APPLICATION LIQUID FOR OPTICAL MEMBER, POLYMER, PHOTOSENSITIVE APPLICATION LIQUID, METHOD FOR PRODUCING CURED FILM, METHOD FOR PRODUCING PATTERNED CURED FILM, AND METHOD FOR PRODUCING POLYMER CENTRAL GLASS COMPANY, LIMITED (JP) 2023-12-21 US disclosed
CN-116601244-A Coating liquid for optical member, polymer, cured film, photosensitive coating liquid, pattern cured film, optical member, solid-state imaging element, display device, silicone compound, stabilizer used in coating liquid, method for producing cured film, method for producing pattern cured film, and method for producing polymer 中央硝子株式会社 2023-08-15 CN disclosed
US-20220282100-A1 METAL OXIDE FILM-FORMING COMPOSITION, AND METHOD FOR PRODUCING METAL OXIDE FILM USING THE SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2022-09-08 US disclosed
US-20220274912-A1 METAL OXIDE FILM-FORMING COMPOSITION, METHOD FOR PRODUCING METAL OXIDE FILM USING THE SAME, TERTIARY ALKYLOXYCARBONYL GROUP-MODIFIED BISNAPHTHOL FLUORENE COMPOUND, AND METHOD FOR PRODUCING THE SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2022-09-01 US disclosed
US-20210200098-A1 PATTERN FORMING METHOD AND RESIST LAMINATE FOR ORGANIC SOLVENT DEVELOPMENT FUJIFILM CORPORATION (JP) 2021-07-01 US disclosed
US-20190025699-A1 FILM-FORMING MATERIAL FOR RESIST PROCESS AND PATTERN-FORMING METHOD JSR CORPORATION (JP) 2019-01-24 US disclosed
EP-2518562-B1 A patterning process SHINETSU CHEMICAL CO (JP) 2019-01-16 EP disclosed
EP-2426558-B1 Silicon-containing film-forming composition, silicon-containing film-formed substrate, and patterning process SHINETSU CHEMICAL CO (JP) 2018-10-24 EP disclosed
US-20120238095-A1 PATTERNING PROCESS AND COMPOSITION FOR FORMING SILICON-CONTAINING FILM USABLE THEREFOR SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-09-20 US disclosed
EP-2500775-A2 Patterning process and composition for forming silicon-containing film usable therefor Shin-Etsu Chemical Co., Ltd. (JP) 2012-09-19 EP disclosed
EP-2426558-A1 Silicon-containing film-forming composition, silicon-containing film-formed substrate, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2012-03-07 EP disclosed
US-20120052685-A1 SILICON-CONTAINING FILM-FORMING COMPOSITION, SILICON-CONTAINING FILM-FORMED SUBSTRATE, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-01 US disclosed
US-8029974-B2 Metal oxide-containing film-forming composition, metal oxide-containing film-formed substrate, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-10-04 US disclosed
US-20100285407-A1 Composition for forming a silicon-containing antireflection film, substrate having the silicon-containing antireflection film from the composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-11 US disclosed
US-20100147334-A1 Coated-type silicon-containing film stripping process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-17 US disclosed
EP-2196858-A1 Coated-type silicon-containing film stripping process Shin-Etsu Chemical Co., Ltd. (JP) 2010-06-16 EP disclosed
US-20100086872-A1 Metal oxide-containing film-forming composition, metal oxide-containing film-formed substrate, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-04-08 US disclosed
EP-2172808-A1 Metal oxide-containing film-forming composition metal oxide-containing film-formed substrate, and patterning process Shinetsu Chemical Co., Ltd. (JP) 2010-04-07 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20220274912-A1 METAL OXIDE FILM-FORMING COMPOSITION, METHOD FOR PRODUCING METAL OXIDE FILM USING THE SAME, TERTIARY ALKYLOXYCARBONYL GROUP-MODIFIED BISNAPHTHOL FLUORENE COMPOUND, AND METHOD FOR PRODUCING THE SAME MCOLN1, MCOLN2, H1-0 CA2 1663/4885CA1 631/4885MAPK1 3768/4885
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SMC1A, SPOUT1, LBR CA2 2105/4885CA1 964/4885MAPK1 1151/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.