SCHEMBL12412382

SCHEMBL12412382

CCCC[S+](C)c1ccccc1

nearest known ligand 0.43

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
LTA4H P09960 2/20 0.36
PCSK9 Q8NBP7 1/20 0.36
PTGS2 P35354 1/20 0.35
ALDH1A1 P00352 1/20 0.35
MAPT P10636 1/20 0.35
NPSR1 Q6W5P4 1/20 0.35
CES2 O00748 2/20 0.34
CES1 P23141 2/20 0.34
SMN1; SMN2 Q16637 1/20 0.34
SIGMAR1 Q99720 1/20 0.34
ESR1 P03372 1/20 0.34
TP53 P04637 1/20 0.33
OPRM1 P35372 1/20 0.33
OPRL1 P41146 1/20 0.33
TDP1 Q9NUW8 1/20 0.33
TSHR P16473 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4578147 0.91 DNM1 (0.39) LTA4HCES2CES1SMN1; SMN2SIGMAR1
Water SCHEMBL9245728 0.90 DNM1 (0.38) LTA4HCES2CES1SMN1; SMN2SIGMAR1
Hydrochloric Acid SCHEMBL9342824 0.90 MEN1 (0.41) LTA4HMAPTCES2CES1SMN1; SMN2
SCHEMBL5074633 0.85 DNM1 (0.35) ALDH1A1CES2CES1SMN1; SMN2TP53
SCHEMBL11305722 0.85 DNM1 (0.35) ALDH1A1CES2CES1SMN1; SMN2TP53
SCHEMBL1481192 0.79 LTA4H (0.38) LTA4HPCSK9PTGS2CES2CES1
SCHEMBL3201160 0.79 LTA4H (0.38) LTA4HPCSK9PTGS2CES2CES1
SCHEMBL779932 0.76 CES2 (0.37) LTA4HPCSK9PTGS2CES2CES1
SCHEMBL9760714 0.76 CES2 (0.37) LTA4HPCSK9PTGS2CES2CES1
SCHEMBL30828004 0.76 CES2 (0.37) LTA4HPCSK9PTGS2CES2CES1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20170153545-A1 PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-06-01 US disclosed
US-20150301451-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-10-22 US disclosed
US-20110165521-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-07-07 US disclosed