SCHEMBL1348301

SCHEMBL1348301

CCN(CC)c1ccc(/C=C2/CC(C(=O)O)C/C(=C\c3ccc(N(CC)CC)cc3)C2=O)cc1

nearest known ligand 0.56

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
F2 P00734 4/20 0.56
F10 P00742 3/20 0.56
STAT3 P40763 1/20 0.49
ALDH1A1 P00352 7/20 0.48
MEN1 O00255 7/20 0.48
KMT2A Q03164 7/20 0.48
MAPT P10636 5/20 0.48
HPGD P15428 3/20 0.48
POLB P06746 3/20 0.48
THRB P10828 3/20 0.48
MAPK1 P28482 3/20 0.48
PKM P14618 2/20 0.48
MDM2 Q00987 2/20 0.48
L3MBTL1 Q9Y468 2/20 0.48
TNNI3 P19429 2/20 0.48
TNNT2 P45379 2/20 0.48
TNNC1 P63316 2/20 0.48
GAA P10253 2/20 0.48
SMN1; SMN2 Q16637 2/20 0.48
FGFR1 P11362 1/20 0.47

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1348304 1.00 F2 (0.56) F2F10STAT3ALDH1A1MEN1
SCHEMBL1347886 0.85 F2 (0.60) F2F10STAT3ALDH1A1MEN1
SCHEMBL1347925 0.85 USP18 (0.54) STAT3ALDH1A1MEN1KMT2AMAPT
SCHEMBL1347884 0.85 F2 (0.60) F2F10STAT3ALDH1A1MEN1
SCHEMBL1347928 0.85 USP18 (0.54) STAT3ALDH1A1MEN1KMT2AMAPT
SCHEMBL6805427 0.84 ALDH1A1 (0.57) F2F10ALDH1A1MEN1KMT2A
SCHEMBL6805432 0.84 ALDH1A1 (0.57) F2F10ALDH1A1MEN1KMT2A
SCHEMBL355427 0.83 MAPT (0.56) ALDH1A1MEN1KMT2AMAPTHPGD
SCHEMBL2775363 0.83 MAPT (0.56) ALDH1A1MEN1KMT2AMAPTHPGD
SCHEMBL9661326 0.82 ALDH1A1 (0.46) STAT3ALDH1A1MEN1KMT2AMAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 22 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10639876-B2 Solvent-containing dry film and method for applying the same on a substrate ETERNAL MATERIALS CO., LTD. (TW) 2020-05-05 US disclosed
US-10590305-B2 Polyimide dry film and application thereof ETERNAL MATERIALS CO., LTD. (TW) 2020-03-17 US disclosed
US-20180002567-A1 POLYIMIDE DRY FILM AND APPLICATION THEREOF ETERNAL MATERIALS CO., LTD. (TW) 2018-01-04 US disclosed
US-20160017105-A1 SOLVENT-CONTAINING DRY FILM AND METHOD FOR APPLYING THE SAME ON A SUBSTRATE ETERNAL MATERIALS CO., LTD. (TW) 2016-01-21 US disclosed
US-8063245-B2 Phosphazene compound, photosensitive resin composition and use thereof KANEKA CORPORATION (JP) 2011-11-22 US disclosed
US-20110212402-A1 PHOTOSENSITIVE RESIN COMPOSITION AND ITS APPLICATION ETERNAL CHEMICAL CO., LTD. (TW) 2011-09-01 US disclosed
US-20100218984-A1 PHOTOSENSITIVE DRY FILM RESIST, PRINTED WIRING BOARD MAKING USE OF THE SAME, AND PROCESS FOR PRODUCING PRINTED WIRING BOARD KANEKA CORPORATION (JP) 2010-09-02 US disclosed
US-7189488-B2 Polyimide precursor, manufacturing method thereof, and resin composition using polyimide precursor KANEKA CORPORATION (JP) 2007-03-13 US disclosed
US-7141614-B2 Photosensitive resin composition and photosensitive films and laminates made by using the same KANEKA CORPORATION (JP) 2006-11-28 US disclosed
US-20060199920-A1 Photosensitive resin composition capable of being developed with aqueous developer and photosensitive dry film resist, and use thereof KANEKA CORPORATION (JP) 2006-09-07 US disclosed
EP-0814109-B1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL CO LTD (JP) 2004-08-18 EP disclosed
US-6605353-B2 Polyimide derived from a dianhydride and diamine having hydroxyl or carboxyl groups, which are modified with a diepoxide or unsaturated group-containing epoxide; curable; heat resistance, dielectric, film-forming KANEKA CORPORATION (JP) 2003-08-12 US disclosed
US-20030149142-A1 Polyimide precursor, manufacturing method thereof, and resin composition using polyimide precursor KANEKA CORPORATION 2003-08-07 US disclosed
US-20020048726-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 2002-04-25 US disclosed
US-20010056174-A1 Epoxy-modified polyimide, photosensitive composition, coverlay film, solder resist, and printed wiring board using the epoxy-modified polyimide KANEKA CORPORATION (JP) 2001-12-27 US disclosed
US-6319656-B1 FORMING FILM OF A NEGATIVE-WORKING PHOTO-SENSITIVE POLYIMIDE PRECURSOR ON A SUBSTRATE; EXPOSING FILM TO LIGHT THROUGH A MASK HAVING A PREDETERMINED PATTERN; DEVELOPING THE EXPOSED FILM USING AN ALKALINE AQUEOUS SOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2001-11-20 US disclosed
US-6200831-B1 HEAT-CURING A COATING OF A POLYAMIC ACID BASED ON A TETRACARBOXYLIC ACID AND A DIAMINE CONTAINNG AN ACTIVE OXYGEN OR NITROGEN FUNCTIONAL GROUP; SEALING THE EXTERNAL TERMINALS WITH A RESIN, E.G. AN EPOXIDE HITACHI, LTD. (JP) 2001-03-13 US disclosed
US-6087006-A SEMICONDUCTOR DEVICE HAVING SURFACE-PROTECTING FILM COMPRISING POLYIMIDE OBTAINED BY HEAT-CURING PRECURSOR HAVING POLAR SUBSTITUENTS AS THE SIDE CHAINS HITACHI, LTD. (JP) 2000-07-11 US disclosed
US-6025113-A FOR PREPARING HIGHLY SENSITIVE NEGATIVE-WORKING PHOTOSENSITIVE MATERIAL DEVELOPABLE WITH ALKALINE AQUEOUS SOLUTION IN SHORT TIME WITH HIGH RESOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2000-02-15 US disclosed
EP-0814109-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 1997-12-29 EP disclosed