SCHEMBL14739754

SCHEMBL14739754

O=C1C2CC3CC1CC(C(=O)OC(C(F)(F)F)C(F)(F)S(=O)(=O)OS(c1ccccc1)(c1ccccc1)c1ccccc1)(C3)C2

nearest known ligand 0.35

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
MGLL Q99685 5/20 0.35
ALDH1A1 P00352 1/20 0.35
GAA P10253 1/20 0.35
ENPP3 O14638 1/20 0.33
CA2 P00918 1/20 0.33
ENPP1 P22413 1/20 0.33
ENPP2 Q13822 1/20 0.33
CA9 Q16790 1/20 0.33
KDM4E B2RXH2 1/20 0.33
CYP17A1 P05093 4/20 0.32
CYP19A1 P11511 4/20 0.32
GABBR2 O75899 1/20 0.32
GABRB1 P18505 1/20 0.32
GABRB2 P47870 1/20 0.32
GABBR1 Q9UBS5 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL501576 0.92 ALDH1A1 (0.40) MGLLALDH1A1GAAENPP3CA2
SCHEMBL964662 0.85 MEN1 (0.37) MGLLALDH1A1GAAENPP3CA2
SCHEMBL1830512 0.83 ENPP3 (0.36) MGLLALDH1A1GAAENPP3CA2
SCHEMBL26190682 0.81 CYP17A1 (0.34) CYP17A1CYP19A1
SCHEMBL23559488 0.81 EPHX2 (0.35) GAACYP17A1CYP19A1
SCHEMBL18133301 0.81 EPHX2 (0.35) GAACYP17A1CYP19A1
SCHEMBL6448541 0.81 EPHX2 (0.35) GAACYP17A1CYP19A1
SCHEMBL1398376 0.80 ALDH1A1 (0.42) ALDH1A1GAAENPP3CA2ENPP1
SCHEMBL26190812 0.79 CYP17A1 (0.35) CYP17A1CYP19A1
SCHEMBL19042387 0.79 EPHX2 (0.33) ALDH1A1CA2CA9CYP17A1CYP19A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-3229075-B1 PHOTORESIST COMPOSITION, METHOD FOR MANUFACTURING SAME, AND METHOD FOR FORMING RESIST PATTERN JSR CORP (JP) 2021-01-06 EP disclosed
EP-3229075-A1 PHOTORESIST COMPOSITION, METHOD FOR MANUFACTURING SAME, AND METHOD FOR FORMING RESIST PATTERN JSR Corporation (JP) 2017-10-11 EP disclosed
US-20170269476-A1 PHOTORESIST COMPOSITION, PRODUCTION METHOD OF PHOTORESIST COMPOSITION, AND RESIST PATTERN-FORMING METHOD JSR CORPORATION (JP) 2017-09-21 US disclosed
US-9052600-B2 Method for forming resist pattern and composition for forming protective film JSR CORPORATION (JP) 2015-06-09 US disclosed
US-20130059252-A1 METHOD FOR FORMING RESIST PATTERN AND COMPOSITION FOR FORMING PROTECTIVE FILM JSR CORPORATION (JP) 2013-03-07 US disclosed