SCHEMBL1476610

SCHEMBL1476610

CC=COCC(C)(C)COC=CC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10070949 0.82
SCHEMBL1476763 0.81
SCHEMBL1476790 0.74 THRB (0.31)
SCHEMBL21790384 0.74
SCHEMBL16626031 0.72 ALDH1A1 (0.32)
SCHEMBL1476332 0.72 ALDH1A1 (0.32)
SCHEMBL22229073 0.72
SCHEMBL1477027 0.72 ALDH1A1 (0.37)
SCHEMBL22229074 0.72
SCHEMBL22096237 0.71

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 35 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6916890-B1 Thermally reworkable epoxy resins and compositions based thereon HENKEL CORPORATION (US) 2005-07-12 US claimed
WO-2003031492-A1 THERMALLY REWORKABLE EPOXY RESINS AND COMPOSITIONS BASED THEREO N HENKEL CORPORATION (US) 2003-04-17 WO claimed
US-5486545-A SOLVENT RESISTANCE RENSSELAER POLYTECHNIC INSTITUTE (US) 1996-01-23 US claimed
EP-2813892-B1 Photoresist underlayer film-forming composition and pattern forming processes SHINETSU CHEMICAL CO (JP) 2020-06-17 EP disclosed
US-10228621-B2 Underlayer film-forming composition and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2019-03-12 US disclosed
US-10156788-B2 Resist underlayer film composition, patterning process, and compound SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-12-18 US disclosed
EP-2813890-B1 Photoresist underlayer film-forming composition and pattern forming processes SHINETSU CHEMICAL CO (JP) 2018-05-30 EP disclosed
US-9984878-B2 Resist under layer film composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-05-29 US disclosed
US-9899218-B2 Resist under layer film composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-02-20 US disclosed
EP-2813889-B1 Photoresist underlayer film-forming composition and pattern forming process SHINETSU CHEMICAL CO (JP) 2018-02-07 EP disclosed
EP-2813891-B1 Photoresist underlayer film-forming composition and pattern forming process SHINETSU CHEMICAL CO (JP) 2018-01-17 EP disclosed
US-7271219-B2 Useful as overcoating materials and interlayer insulating materials for wiring boards SANYO CHEMICAL INDUSTRIES, LTD. (JP) 2007-09-18 US disclosed
US-20060162771-A1 Sealing agent for photoelectric conversion element and photoelectric conversion device element using the same NIPPON KAYAKU KABUSHIKI KAISHA (JP) 2006-07-27 US disclosed
US-7009009-B1 Fluxing underfill compositions HENKEL CORPORATION (US) 2006-03-07 US disclosed
EP-1598897-A1 SEALING AGENT FOR PHOTOELECTRIC CONVERSION ELEMENT AND PHOTOELECTRIC CONVERSION ELEMENT USING THE SAME Nippon Kayaku Kabushiki Kaisha (JP) 2005-11-23 EP disclosed
US-6916890-B1 Thermally reworkable epoxy resins and compositions based thereon HENKEL CORPORATION (US) 2005-07-12 US disclosed
US-20040102601-A1 Useful as overcoating materials and interlayer insulating materials for wiring boards SANYO CHEMICAL INDUSTRIES, LTD. (JP) 2004-05-27 US disclosed
EP-1375553-A1 CURABLE RESIN, CURABLE RESIN MATERIAL, CURABLE FILM, AND INSULATOR SANYO CHEMICAL INDUSTRIES, LTD. (JP) 2004-01-02 EP disclosed
US-6667194-B1 Method of bonding die chip with underfill fluxing composition HENKEL LOCTITE CORPORATION 2003-12-23 US disclosed
WO-2003031492-A1 THERMALLY REWORKABLE EPOXY RESINS AND COMPOSITIONS BASED THEREO N HENKEL CORPORATION (US) 2003-04-17 WO disclosed