SCHEMBL14838151

SCHEMBL14838151

C=Cc1c(F)c(F)c(Oc2c(F)c(F)c(S(=O)(=O)O)c(F)c2F)c(F)c1F

nearest known ligand 0.34

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
▸ CA1 P00915 2/20 0.34
▸ CA2 P00918 2/20 0.34
▸ CA12 O43570 1/20 0.34
▸ CA7 P43166 1/20 0.34
▸ CA13 Q8N1Q1 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2742187 0.88 CA1 (0.37) CA1CA2CA12CA7CA13
SCHEMBL2000560 0.78 CA1 (0.40) CA1CA2CA12CA7CA13
SCHEMBL15189382 0.77 TDP1 (0.46) CA1CA2CA12CA7CA13
SCHEMBL16683027 0.76 TRPA1 (0.38) —
SCHEMBL16683010 0.75 TDP1 (0.44) CA1CA2CA12CA7CA13
SCHEMBL16683024 0.73 CA12 (0.44) CA1CA2CA12CA7CA13
SCHEMBL17577091 0.73 THRB (0.33) —
SCHEMBL16865900 0.73 ALDH1A1 (0.32) CA1CA2CA12CA7CA13
SCHEMBL2875483 0.72 CA2 (0.48) CA1CA2CA12CA7CA13
SCHEMBL261697 0.71 CA1 (0.33) CA1CA2CA12CA7CA13

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20150118628-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC-RAY- OR RADIATION-SENSITIVE FILM THEREFROM, METHOD OF FORMING PATTERN, PROCESS FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2015-04-30 — — US disclosed
US-20150118628-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC-RAY- OR RADIATION-SENSITIVE FILM THEREFROM, METHOD OF FORMING PATTERN, PROCESS FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2015-04-30 — — US disclosed
WO-2013047895-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM AND PATTERN FORMING METHOD EACH USING THE COMPOSITION, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE AND PRODUCTION METHOD OF RESIN FUJIFILM CORPORATION (JP) 2013-04-04 — — WO disclosed
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