SCHEMBL15134153

SCHEMBL15134153

OCc1c(O)c(CO)c(CO)c(CO)c1CO

nearest known ligand 0.46

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
ERBB2 P04626 1/20 0.46
PIM1 P11309 1/20 0.46
HKDC1 Q2TB90 1/20 0.46
DRD4 P21917 1/20 0.45
PDXK O00764 1/20 0.33
KDM4E B2RXH2 1/20 0.33
ALDH1A1 P00352 1/20 0.33
HPGD P15428 1/20 0.33
HSD17B10 Q99714 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3090283 0.96 ERBB2 (0.48) ERBB2PIM1HKDC1DRD4PDXK
SCHEMBL1525964 0.82 DRD4 (0.39) ERBB2PIM1HKDC1DRD4
SCHEMBL16597206 0.79 ERBB2 (0.39) ERBB2PIM1HKDC1DRD4KDM4E
SCHEMBL14446394 0.79 LMNA (0.39) ERBB2PIM1HKDC1DRD4
SCHEMBL9812437 0.74 TSHR (0.47) ERBB2PIM1HKDC1DRD4PDXK
SCHEMBL12744505 0.74 ERBB2 (0.40) ERBB2PIM1HKDC1DRD4PDXK
SCHEMBL16592889 0.73 GABRA1 (0.39) ERBB2PIM1HKDC1DRD4KDM4E
SCHEMBL5516684 0.72 KDM4E (0.38) ERBB2PIM1HKDC1DRD4KDM4E
SCHEMBL2798558 0.72 KDM4E (0.38) ERBB2PIM1HKDC1DRD4KDM4E
SCHEMBL10130850 0.68 CA2 (0.50) ERBB2PIM1HKDC1DRD4KDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9746772-B2 Resist underlayer film forming composition for lithography containing polyether structure-containing resin NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2017-08-29 US disclosed
US-20160320704-A1 RESIST UNDERLAYER FILM FORMING COMPOSITION FOR LITHOGRAPHY CONTAINING POLYETHER STRUCTURE-CONTAINING RESIN NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2016-11-03 US disclosed
US-20130189533-A1 RESIST UNDERLAYER FILM FORMING COMPOSITION FOR LITHOGRAPHY CONTAINING POLYETHER STRUCTURE-CONTAINING RESIN NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2013-07-25 US disclosed