SCHEMBL15219463

SCHEMBL15219463

CCC(=O)OC(C1CCCCC1)C1CCCCC1

nearest known ligand 0.42

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
SHBG P04278 1/20 0.40
EPHX1 P07099 4/20 0.38
EPHX2 P34913 3/20 0.36
NAAA Q02083 1/20 0.36
CHRM2 P08172 1/20 0.36
CHRM4 P08173 1/20 0.36
CHRM1 P11229 1/20 0.36
CHRM3 P20309 1/20 0.36
ALDH1A1 P00352 4/20 0.36
NPSR1 Q6W5P4 2/20 0.36
TSHR P16473 1/20 0.35
CTSK P43235 1/20 0.34
KDM4E B2RXH2 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6352698 0.86 ALDH1A1 (0.34) SHBGEPHX1EPHX2NAAACHRM2
SCHEMBL3784779 0.84 SHBG (0.40) SHBGEPHX1EPHX2NAAACHRM2
SCHEMBL3858544 0.83 EPHX1 (0.40) EPHX1EPHX2NAAAALDH1A1KDM4E
SCHEMBL25022787 0.81 EPHX1 (0.38) SHBGEPHX1EPHX2NAAACHRM2
SCHEMBL10885190 0.81 SHBG (0.38) SHBGEPHX1EPHX2NAAACHRM2
SCHEMBL29094051 0.81 SHBG (0.42) SHBGEPHX1EPHX2NAAACHRM2
SCHEMBL27977643 0.81 SHBG (0.38) SHBGEPHX1EPHX2NAAACHRM2
SCHEMBL28766886 0.80 CHRM2 (0.36) SHBGEPHX1EPHX2NAAACHRM2
SCHEMBL5988036 0.80 EPHX1 (0.38) EPHX1EPHX2ALDH1A1NPSR1KDM4E
SCHEMBL27437211 0.79 NPSR1 (0.36) EPHX1EPHX2ALDH1A1NPSR1CTSK

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9612535-B2 Pattern forming method, electron beam- or extreme ultraviolet-sensitive resin composition, resist film using the same, method of manufacturing electronic device, and electronic device FUJIFILM CORPORATION (JP) 2017-04-04 US disclosed
WO-2013125733-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THE SAME AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2013-08-29 WO disclosed