SCHEMBL1608984

SCHEMBL1608984

CCCCCO[SiH](Oc1ccccc1)Oc1ccccc1

nearest known ligand 0.53

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
LTA4H P09960 2/20 0.53
KCNA3 P22001 1/20 0.43
MLNR O43193 1/20 0.42
NR1I2 O75469 1/20 0.42
ESR1 P03372 1/20 0.42
NR3C1 P04150 1/20 0.42
PGR P06401 1/20 0.42
ADRB2 P07550 1/20 0.42
CHRM2 P08172 1/20 0.42
ADRB1 P08588 1/20 0.42
HTR1A P08908 1/20 0.42
ADRA2A P08913 1/20 0.42
ADORA3 P0DMS8 1/20 0.42
CHRM1 P11229 1/20 0.42
DRD2 P14416 1/20 0.42
ADRA2B P18089 1/20 0.42
ADRA2C P18825 1/20 0.42
CHRM3 P20309 1/20 0.42
MAOA P21397 1/20 0.42
CNR1 P21554 1/20 0.42

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5355452 0.94 LTA4H (0.53) LTA4HKCNA3MLNRNR1I2ESR1
SCHEMBL1608013 0.86 LTA4H (0.42) LTA4HKCNA3MLNRNR1I2ESR1
SCHEMBL3354969 0.81 HDAC3 (0.58) LTA4HKCNA3DRD2DRD3ALDH1A1
SCHEMBL1609017 0.78 LTA4H (0.43) LTA4HKCNA3LMNATSHRTP53
SCHEMBL19809146 0.76 CETP (0.44) LTA4HCNR1CYP3A4MAPK1ALDH1A1
SCHEMBL369785 0.76 LTA4H (0.84) LTA4HKCNA3MLNRNR1I2ESR1
SCHEMBL28693072 0.75 LTA4H (0.49) LTA4HKCNA3MLNRNR1I2ESR1
SCHEMBL28693073 0.75 LTA4H (0.49) LTA4HKCNA3MLNRNR1I2ESR1
SCHEMBL9498549 0.75 ALDH1A1 (0.45) LTA4HKCNA3ESR1DRD2DRD3
SCHEMBL19809145 0.75 LMNA (0.45) LTA4HCYP3A4MAPK1ALDH1A1LMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 44 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9870924-B2 Diffusion agent composition, method of forming impurity diffusion layer, and solar cell TOKYO OHKA KOGYO CO., LTD. (JP) 2018-01-16 US disclosed
EP-2131423-B1 NEGATIVE ELECTRODE BASE MEMBER TOKYO OHKA KOGYO CO LTD (JP) 2017-11-15 EP disclosed
EP-2573800-B1 DIFFUSION AGENT COMPOSITION AND METHOD OF FORMING AN IMPURITY DIFFUSION LAYER TOKYO OHKA KOGYO CO LTD (JP) 2017-11-08 EP disclosed
US-9708492-B2 LED device and coating liquid used for production of same Konica Minolta, Inc. (JP) 2017-07-18 US disclosed
US-20160002526-A1 PHOSPHOR DISPERSION, LED DEVICE AND METHOD FOR MANUFACTURING SAME Konica Minolta, Inc. (JP) 2016-01-07 US disclosed
US-20150353740-A1 LED DEVICE AND COATING LIQUID USED FOR PRODUCTION OF SAME Konica Minolta, Inc. (JP) 2015-12-10 US disclosed
US-20150333233-A1 LIGHT EMITTING DEVICE Konica Minolta, Inc. (JP) 2015-11-19 US disclosed
EP-2945197-A1 LED DEVICE AND COATING LIQUID USED FOR PRODUCTION OF SAME Konica Minolta, Inc. (JP) 2015-11-18 EP disclosed
US-9190276-B2 Method of diffusing impurity-diffusing component and method of manufacturing solar cell TOKYO OHKA KOGYO CO., LTD. (JP) 2015-11-17 US disclosed
US-9184352-B2 Phosphor dispersion liquid, and production method for LED device using same Konica Minolta, Inc. (JP) 2015-11-10 US disclosed
US-20130109123-A1 DIFFUSING AGENT COMPOSITION AND METHOD OF FORMING IMPURITY DIFFUSION LAYER TOKYO OHKA KOGYO CO., LTD. (JP) 2013-05-02 US disclosed
EP-2573800-A1 DIFFUSION AGENT COMPOSITION, METHOD OF FORMING AN IMPURITY DIFFUSION LAYER, AND SOLAR CELL Tokyo Ohka Kogyo Co., Ltd. (JP) 2013-03-27 EP disclosed
US-20130061922-A1 DIFFUSION AGENT COMPOSITION, METHOD OF FORMING IMPURITY DIFFUSION LAYER, AND SOLAR CELL TOKYO OHKA KOGYO CO., LTD. (JP) 2013-03-14 US disclosed
EP-2472655-A1 Negative electrode base member Tokyo Ohka Kogyo Co., Ltd. (JP) 2012-07-04 EP disclosed
US-20110079262-A1 DIFFUSING AGENT COMPOSITION, METHOD OF FORMING IMPURITY DIFFUSION LAYER, AND SOLAR BATTERY TOKYO OHKA KOGYO CO., LTD. (JP) 2011-04-07 US disclosed
US-20110017291-A1 DIFFUSING AGENT COMPOSITION FOR INK-JET, AND METHOD FOR PRODUCTION OF ELECTRODE OR SOLAR BATTERY USING THE COMPOSITION TOKYO OHKA KOGYO CO., LTD. (JP) 2011-01-27 US disclosed
US-20100119939-A1 NEGATIVE ELECTRODE BASE MEMBER TOKYO OHKA KOGYO CO., LTD. (JP) 2010-05-13 US disclosed
EP-2131423-A1 NEGATIVE ELECTRODE BASE MEMBER Tokyo Ohka Kogyo Co., Ltd. (JP) 2009-12-09 EP disclosed
US-7238462-B2 Undercoating material for wiring, embedded material, and wiring formation method TOKYO OHKA KOGYO CO., LTD. (JP) 2007-07-03 US disclosed
US-20050074695-A1 Undercoating material for wiring, embedded material, and wiring formation method TOKYO OHKA KOGYO CO., LTD. (JP) 2005-04-07 US disclosed