SCHEMBL1717549

SCHEMBL1717549

Clc1ccc([Si](Cl)(Cl)Cl)cc1Cl

nearest known ligand 0.46

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
AHR P35869 4/20 0.46
TP53 P04637 1/20 0.46
TSHR P16473 4/20 0.42
HSD17B10 Q99714 2/20 0.42
CYP3A4 P08684 1/20 0.42
CYP1B1 Q16678 1/20 0.39
IDO1 P14902 1/20 0.37
ALDH1A1 P00352 1/20 0.37
NPC1 O15118 1/20 0.35
RAB9A P51151 1/20 0.35
PNMT P11086 1/20 0.34
TAAR1 Q96RJ0 1/20 0.34
NOTUM Q6P988 1/20 0.34
MEN1 O00255 1/20 0.34
KMT2A Q03164 1/20 0.34
HAO1 Q9UJM8 1/20 0.34
LMNA P02545 1/20 0.33
HTR3E A5X5Y0 1/20 0.33
HTR3B O95264 1/20 0.33
HTR3A P46098 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29406928 1.00 AHR (0.46) AHRTP53TSHRHSD17B10CYP3A4
SCHEMBL5483431 0.77 CYP3A4 (0.48) CYP3A4ALDH1A1NPC1RAB9AMEN1
SCHEMBL12226216 0.76 AHR (0.43) AHRTP53TSHRHSD17B10CYP3A4
SCHEMBL31250605 0.76 AHR (0.43) AHRTP53TSHRHSD17B10CYP3A4
SCHEMBL5487414 0.72 MAPT (0.44) TP53HSD17B10ALDH1A1NPC1RAB9A
SCHEMBL9631450 0.72 AHR (0.40) AHRTP53TSHRHSD17B10CYP3A4
SCHEMBL16714016 0.67
SCHEMBL134905 0.67 LMNA (0.53) TSHRHSD17B10CYP3A4IDO1ALDH1A1
SCHEMBL5485442 0.67
SCHEMBL2335006 0.65 TSHR (0.44) TP53TSHRCYP3A4IDO1ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 46 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-101657758-B Alkaline-resistant negative photoresist for silicon wet-etch without silicon nitride BREWER SCIENCE INC 2015-03-04 CN claimed
CN-101258444-B Negative photoresist for silicon KOH etch without silicon nitride BREWER SCIENCE INC 2013-04-03 CN claimed
EP-1932060-B1 NEGATIVE PHOTOSENSITIVE COMPOSITION FOR SILICON KOH ETCH WITHOUT USING SILICON NITRIDE HARDMASK BREWER SCIENCE INC (US) 2013-03-27 EP claimed
US-7709178-B2 Photoresist layer blend of acrylonitrile-styrene copolymer, (bis)phenol novolac epoxy resin, and photoacid generator of triarylsulfonium or diaryliodonium hexafluoroantimonate or hexafluoro-phosphate; silane dissolved inprimer layer; microelectromechanical systems, microelectronics; corrosion resistance BREWER SCIENCE INC. (US) 2010-05-04 US claimed
US-7695890-B2 Negative photoresist for silicon KOH etch without silicon nitride BREWER SCIENCE INC. (US) 2010-04-13 US claimed
CN-101657758-A Alkaline-resistant negative photoresist for silicon wet-etch without silicon nitride BREWER SCIENCE INC US 2010-02-24 CN claimed
EP-2142960-A1 ALKALINE-RESISTANT NEGATIVE PHOTORESIST FOR SILICON WET-ETCH WITHOUT SILICON NITRIDE Brewer Science, Inc. (US) 2010-01-13 EP claimed
US-20080261145-A1 Photoresist layer blend of acrylonitrile-styrene copolymer, (bis)phenol novolac epoxy resin, and photoacid generator of triarylsulfonium or diaryliodonium hexafluoroantimonate or hexafluoro-phosphate; silane dissolved inprimer layer; microelectromechanical systems, microelectronics; corrosion resistance NAVY, SECRETARY OF THE UNITED STATES OF AMERICA 2008-10-23 US claimed
WO-2008127785-A1 ALKALINE-RESISTANT NEGATIVE PHOTORESIST FOR SILICON WET-ETCH WITHOUT SILICON NITRIDE BREWER SCIENCE INC. (US) 2008-10-23 WO claimed
CN-101258444-A Negative photoresist for silicon KOH etch without silicon nitride BREWER SCIENCE INC (US) 2008-09-03 CN claimed
US-20070075309-A1 NEGATIVE PHOTORESIST FOR SILICON KOH ETCH WITHOUT SILICON NITRIDE BREWER SCIENCE INC. 2007-04-05 US claimed
US-9299778-B2 CVD-free, scalable processes for the production of silicon micro- and nanostructures BREWER SCIENCE INC. (US) 2016-03-29 US disclosed
CN-101657758-B Alkaline-resistant negative photoresist for silicon wet-etch without silicon nitride BREWER SCIENCE INC 2015-03-04 CN disclosed
US-20140124898-A1 CVD-FREE, SCALABLE PROCESSES FOR THE PRODUCTION OF SILICON MICRO- AND NANOSTRUCTURES BREWER SCIENCE INC. (US) 2014-05-08 US disclosed
US-8445591-B2 Spin-on protective coatings for wet-etch processing of microelectronic substrates BREWER SCIENCE INC. (US) 2013-05-21 US disclosed
CN-1909977-A Spin-on protective coatings for wet-etch processing of microelectronic substrates BREWER SCIENCE INC (US) 2007-02-07 CN disclosed
EP-1715961-A2 SPIN-ON PROTECTIVE COATINGS FOR WET-ETCH PROCESSING OF MICROELECTRONIC SUBSTRATES Brewer Science, Inc. (US) 2006-11-02 EP disclosed
US-20060240181-A1 SPIN-ON PROTECTIVE COATINGS FOR WET-ETCH PROCESSING OF MICROELECTRONIC SUBSTRATES LI CHENGHONG 2006-10-26 US disclosed
WO-2005072489-A2 SPIN-ON PROTECTIVE COATINGS FOR WET-ETCH PROCESSING OF MICROELECTRONIC SUBSTRATES BREWER SCIENCE INC. (US) 2005-08-11 WO disclosed
US-20050158538-A1 Spin-on protective coatings for wet-etch processing of microelectronic substrates BREWER SCIENCE INC. 2005-07-21 US disclosed