SCHEMBL17812779

SCHEMBL17812779

CCC(C)c1ccc(C(O)(CC)C23CC4CC(CC(C4)C2)C3)cc1

nearest known ligand 0.40

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
NPSR1 Q6W5P4 1/20 0.36
KMT2A Q03164 2/20 0.34
MEN1 O00255 1/20 0.34
VDR P11473 1/20 0.34
TSHR P16473 2/20 0.33
ALDH1A1 P00352 2/20 0.33
CYP2C9 P11712 1/20 0.33
USP2 O75604 1/20 0.32
GAA P10253 1/20 0.32
PKM P14618 1/20 0.32
HPGD P15428 1/20 0.32
ALOX15 P16050 1/20 0.32
HSD17B10 Q99714 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17812748 0.84 KMT2A (0.38) NPSR1KMT2AMEN1TSHRALDH1A1
SCHEMBL18905354 0.82 VDR (0.36) KMT2AMEN1VDR
SCHEMBL17812620 0.76 HSD17B10 (0.34) NPSR1KMT2AMEN1VDRALDH1A1
SCHEMBL13918202 0.72 ALDH1A1 (0.38) NPSR1KMT2AMEN1TSHRALDH1A1
SCHEMBL15179715 0.72 MEN1 (0.34) NPSR1KMT2AMEN1TSHRALDH1A1
SCHEMBL18802868 0.72 NPSR1 (0.37) NPSR1TSHRALDH1A1HPGDALOX15
SCHEMBL19164567 0.72 ALDH1A1 (0.43) NPSR1KMT2ATSHRALDH1A1CYP2C9
SCHEMBL10204898 0.70 ALOX15 (0.41) NPSR1KMT2AMEN1TSHRALDH1A1
SCHEMBL18014638 0.70 ALDH1A1 (0.42) NPSR1KMT2AMEN1TSHRALDH1A1
SCHEMBL13934892 0.69 RORC (0.43) NPSR1KMT2AMEN1TSHRALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9971245-B2 Silicon-containing polymer, silicon-containing compound, composition for forming a resist under layer film, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-05-15 US disclosed
US-9904172-B2 Shrink material and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-02-27 US disclosed
US-20160229939-A1 SILICON-CONTAINING POLYMER, SILICON-CONTAINING COMPOUND, COMPOSITION FOR FORMING A RESIST UNDER LAYER FILM, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-08-11 US disclosed
US-20160161850-A1 SHRINK MATERIAL AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-06-09 US disclosed