SCHEMBL18120332

SCHEMBL18120332

C=Cc1ccc(OC(OCCc2ccccc2)C2CCCC2)cc1

nearest known ligand 0.37

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
▸ PPARG P37231 6/20 0.34
▸ PPARA Q07869 5/20 0.34
▸ HPGD P15428 2/20 0.34
▸ KDM4E B2RXH2 1/20 0.32
▸ ALDH1A1 P00352 1/20 0.32
▸ NPC1 O15118 1/20 0.32
▸ RAB9A P51151 1/20 0.32
▸ CHRNA7 P36544 3/20 0.32
▸ CHRNB2 P17787 2/20 0.32
▸ CHRNB4 P30926 2/20 0.32
▸ CHRNA3 P32297 2/20 0.32
▸ CHRNA4 P43681 2/20 0.32
▸ FOXM1 Q08050 1/20 0.32
▸ SIGMAR1 Q99720 1/20 0.32
▸ IDO1 P14902 1/20 0.31
▸ S1PR1 P21453 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL18120331 0.99 PPARG (0.34) PPARGPPARAHPGDKDM4EALDH1A1
SCHEMBL18961217 0.79 SLC7A5 (0.40) KDM4EALDH1A1
SCHEMBL18120330 0.78 CHRNB2 (0.35) HPGDKDM4EALDH1A1NPC1RAB9A
SCHEMBL18961216 0.78 SLC7A5 (0.40) KDM4EALDH1A1
SCHEMBL685739 0.77 PPARG (0.38) PPARGPPARAHPGDALDH1A1NPC1
SCHEMBL18120335 0.74 ALDH1A1 (0.35) HPGDKDM4EALDH1A1NPC1RAB9A
SCHEMBL6757935 0.73 PPARG (0.36) PPARGPPARAHPGDALDH1A1NPC1
SCHEMBL12159411 0.73 SMN1; SMN2 (0.37) HPGDKDM4EALDH1A1NPC1RAB9A
SCHEMBL18120334 0.72 ALDH1A1 (0.34) HPGDKDM4EALDH1A1NPC1RAB9A
SCHEMBL20411177 0.72 SMN1; SMN2 (0.39) HPGDKDM4EALDH1A1NPC1RAB9A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9946157-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-04-17 — — US disclosed
US-9946157-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-04-17 — — US disclosed
US-9740097-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-08-22 — — US disclosed
US-9740097-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-08-22 — — US disclosed
US-20160291464-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-10-06 — — US disclosed
US-20160291466-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-10-06 — — US disclosed
US-20160291464-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-10-06 — — US disclosed
US-20160291466-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-10-06 — — US disclosed
US-20160291467-A1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-10-06 — — US disclosed
US-20160291467-A1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-10-06 — — US disclosed
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