SCHEMBL1896439

SCHEMBL1896439

C=Cc1ccc(C(=O)OC2(CC)CCC(=O)OC2)cc1

nearest known ligand 0.34

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
TAS1R3 Q7RTX0 2/20 0.34
TAS1R1 Q7RTX1 2/20 0.34
PIM1 P11309 1/20 0.31
RARB P10826 1/20 0.30
RARG P13631 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1900389 0.88 TAS1R3 (0.35) TAS1R3TAS1R1PIM1RARBRARG
SCHEMBL1901746 0.84 RARB (0.34) TAS1R3TAS1R1PIM1RARBRARG
SCHEMBL1901036 0.81 TAS1R3 (0.34) TAS1R3TAS1R1PIM1RARBRARG
SCHEMBL9963791 0.80 TAS1R3 (0.40) TAS1R3TAS1R1PIM1
SCHEMBL24948256 0.79 TAS1R3 (0.39) TAS1R3TAS1R1PIM1
SCHEMBL1898983 0.79 TAS1R3 (0.35) TAS1R3TAS1R1PIM1
SCHEMBL1897345 0.77 ATM (0.33)
SCHEMBL1898804 0.75 TAS1R3 (0.38) TAS1R3TAS1R1PIM1RARBRARG
SCHEMBL1900731 0.74 TAS1R3 (0.34) TAS1R3TAS1R1PIM1
SCHEMBL1898289 0.74 PIM1 (0.34) TAS1R3TAS1R1PIM1RARBRARG

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20080160449-A1 Photoresist polymer having nano-smoothness and etching resistance, and resist composition LION CORPORATION (JP) 2008-07-03 US claimed
US-20110198730-A1 HYPERBRANCHED POLYMER SYNTHESIZING METHOD, HYPERBRANCHED POLYMER, RESIST COMPOSITION, SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION METHOD LION CORPORATION 2011-08-18 US disclosed
US-20110101503-A1 HYPERBRANCHED POLYMER SYNTHESIZING METHOD, HYPERBRANCHED POLYMER, RESIST COMPOSITION, SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION METHOD LION CORPORATION (JP) 2011-05-05 US disclosed
US-20080160449-A1 Photoresist polymer having nano-smoothness and etching resistance, and resist composition LION CORPORATION (JP) 2008-07-03 US disclosed