SCHEMBL1901036

SCHEMBL1901036

C=Cc1ccc(C(=O)OC2(CC)CCOC(=O)C2)cc1

nearest known ligand 0.34

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
TAS1R3 Q7RTX0 2/20 0.34
TAS1R1 Q7RTX1 2/20 0.34
RARA P10276 1/20 0.33
RARB P10826 1/20 0.33
RARG P13631 1/20 0.33
LMNA P02545 1/20 0.33
CYP2C9 P11712 1/20 0.33
MAPK1 P28482 1/20 0.31
PIM1 P11309 1/20 0.31
SNCA P37840 1/20 0.31
PRKCA P17252 2/20 0.30
PRKCE Q02156 2/20 0.30
RASGRP3 Q8IV61 2/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1900389 0.88 TAS1R3 (0.35) TAS1R3TAS1R1RARBRARGMAPK1
SCHEMBL1900520 0.82 LMNA (0.38) TAS1R3TAS1R1RARARARBRARG
SCHEMBL1896439 0.81 TAS1R3 (0.34) TAS1R3TAS1R1RARBRARGPIM1
SCHEMBL9963791 0.80 TAS1R3 (0.40) TAS1R3TAS1R1LMNACYP2C9PIM1
SCHEMBL1898804 0.80 TAS1R3 (0.38) TAS1R3TAS1R1RARARARBRARG
SCHEMBL24948256 0.79 TAS1R3 (0.39) TAS1R3TAS1R1LMNACYP2C9PIM1
SCHEMBL1896908 0.77 LMNA (0.39) LMNACYP2C9
SCHEMBL1900931 0.75 TAS1R3 (0.36) TAS1R3TAS1R1RARARARBRARG
SCHEMBL1901246 0.74 RARB (0.38) TAS1R3TAS1R1RARARARBRARG
SCHEMBL1898338 0.74 RARB (0.35) RARBRARGPIM1SNCAPRKCA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20080160449-A1 Photoresist polymer having nano-smoothness and etching resistance, and resist composition LION CORPORATION (JP) 2008-07-03 US claimed
US-20110198730-A1 HYPERBRANCHED POLYMER SYNTHESIZING METHOD, HYPERBRANCHED POLYMER, RESIST COMPOSITION, SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION METHOD LION CORPORATION 2011-08-18 US disclosed
US-20110101503-A1 HYPERBRANCHED POLYMER SYNTHESIZING METHOD, HYPERBRANCHED POLYMER, RESIST COMPOSITION, SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION METHOD LION CORPORATION (JP) 2011-05-05 US disclosed
US-20080160449-A1 Photoresist polymer having nano-smoothness and etching resistance, and resist composition LION CORPORATION (JP) 2008-07-03 US disclosed