SCHEMBL1898289

SCHEMBL1898289

C=Cc1ccc(C(=O)OC2(C)CCC(=O)O2)cc1

nearest known ligand 0.34

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
PIM1 P11309 1/20 0.34
TAS1R3 Q7RTX0 3/20 0.34
TAS1R1 Q7RTX1 3/20 0.34
ALDH1A1 P00352 2/20 0.33
POLB P06746 2/20 0.32
RARB P10826 2/20 0.32
RARG P13631 2/20 0.32
RARA P10276 1/20 0.32
MAPT P10636 1/20 0.32
MAPK1 P28482 1/20 0.32
KMT2A Q03164 1/20 0.32
PRKCA P17252 2/20 0.31
PRKCE Q02156 2/20 0.31
RASGRP3 Q8IV61 2/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1901510 0.92 TAS1R3 (0.35) PIM1TAS1R3TAS1R1ALDH1A1POLB
SCHEMBL1898983 0.81 TAS1R3 (0.35) PIM1TAS1R3TAS1R1ALDH1A1MAPK1
SCHEMBL1901746 0.80 RARB (0.34) PIM1TAS1R3TAS1R1ALDH1A1RARB
SCHEMBL1900731 0.77 TAS1R3 (0.34) PIM1TAS1R3TAS1R1ALDH1A1MAPT
SCHEMBL14527796 0.75 CYP19A1 (0.38) PIM1TAS1R3TAS1R1ALDH1A1RARB
SCHEMBL1900520 0.74 LMNA (0.38) PIM1TAS1R3TAS1R1ALDH1A1RARB
SCHEMBL1896439 0.74 TAS1R3 (0.34) PIM1TAS1R3TAS1R1RARBRARG
SCHEMBL1898048 0.74 PRKCA (0.34) PRKCA
SCHEMBL24948267 0.74 ALDH1A1 (0.38) PIM1TAS1R3TAS1R1ALDH1A1POLB
SCHEMBL1901246 0.74 RARB (0.38) PIM1TAS1R3TAS1R1ALDH1A1POLB

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20080160449-A1 Photoresist polymer having nano-smoothness and etching resistance, and resist composition LION CORPORATION (JP) 2008-07-03 US claimed
US-20110198730-A1 HYPERBRANCHED POLYMER SYNTHESIZING METHOD, HYPERBRANCHED POLYMER, RESIST COMPOSITION, SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION METHOD LION CORPORATION 2011-08-18 US disclosed
US-20110101503-A1 HYPERBRANCHED POLYMER SYNTHESIZING METHOD, HYPERBRANCHED POLYMER, RESIST COMPOSITION, SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION METHOD LION CORPORATION (JP) 2011-05-05 US disclosed
US-20080160449-A1 Photoresist polymer having nano-smoothness and etching resistance, and resist composition LION CORPORATION (JP) 2008-07-03 US disclosed