SCHEMBL2026422

SCHEMBL2026422

C/C(C(=O)O)=C(\O)C12CC3CC(CC(C3)C1)C2

nearest known ligand 0.52

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
GLA P06280 1/20 0.44
HSD11B1 P28845 4/20 0.40
L3MBTL1 Q9Y468 1/20 0.39
HTT P42858 2/20 0.39
KDM4E B2RXH2 1/20 0.39
ALDH1A1 P00352 3/20 0.38
EPHX1 P07099 2/20 0.38
CA2 P00918 1/20 0.38
MAPT P10636 1/20 0.37
POLB P06746 1/20 0.37
THRB P10828 1/20 0.36
CYP2C9 P11712 1/20 0.36
CRHBP P24387 1/20 0.36
CRHR2 Q13324 1/20 0.36
MCOLN3 Q8TDD5 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL906383 1.00 GLA (0.44) GLAHSD11B1L3MBTL1HTTKDM4E
SCHEMBL524018 0.83 GLA (0.44) GLAHSD11B1L3MBTL1HTTKDM4E
SCHEMBL1218819 0.83 GLA (0.44) GLAHSD11B1L3MBTL1HTTKDM4E
SCHEMBL524017 0.83 GLA (0.44) GLAHSD11B1L3MBTL1HTTKDM4E
SCHEMBL1055413 0.81 HSD11B1 (0.47) HSD11B1L3MBTL1KDM4EALDH1A1THRB
SCHEMBL14777571 0.76 CA2 (0.44) GLAHSD11B1L3MBTL1ALDH1A1EPHX1
SCHEMBL3207184 0.76 HSD11B1 (0.40) GLAHSD11B1L3MBTL1HTTKDM4E
SCHEMBL3207190 0.76 HSD11B1 (0.40) GLAHSD11B1L3MBTL1HTTKDM4E
SCHEMBL14777575 0.76 CA2 (0.44) GLAHSD11B1L3MBTL1ALDH1A1EPHX1
SCHEMBL595456 0.76 HSD11B1 (0.40) GLAHSD11B1HTTKDM4EALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 29 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10670965-B2 Polymers and photoresist compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2020-06-02 US claimed
US-9983477-B2 Polymers and photoresist compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2018-05-29 US claimed
EP-2527380-B1 Photosensitive compositions ROHM & HAAS ELECT MAT (US) 2013-12-18 EP claimed
US-8507176-B2 Photosensitive compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2013-08-13 US claimed
EP-2341089-B1 Photosensitive compositions ROHM & HAAS ELECT MAT (US) 2013-02-13 EP claimed
US-20110236823-A1 NOVEL POLYMERS AND PHOTORESIST COMPOSITIONS ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2011-09-29 US claimed
EP-2341089-A1 Photosensitive compositions Rohm and Haas Electronic Materials LLC (US) 2011-07-06 EP claimed
US-20110159429-A1 PHOTOSENSITIVE COMPOSITIONS ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2011-06-30 US claimed
US-7838199-B2 Polymers and photoresist compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2010-11-23 US claimed
US-20080206671-A1 Novel polymers and photoresist compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2008-08-28 US claimed
US-10670965-B2 Polymers and photoresist compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2020-06-02 US disclosed
EP-2597518-B1 Compositions and antireflective coatings for photolithography DOW GLOBAL TECHNOLOGIES LLC (US) 2016-12-07 EP disclosed
US-9011591-B2 Compositions and antireflective coatings for photolithography DOW GLOBAL TECHNOLOGIES LLC (US) 2015-04-21 US disclosed
US-8557501-B2 Developable bottom antireflective coating compositions especially suitable for ion implant applications INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-10-15 US disclosed
US-8507176-B2 Photosensitive compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2013-08-13 US disclosed
US-7781144-B2 Positive resist composition and resist pattern forming method TOKYO OHKA KOGYO CO., LTD. (JP) 2010-08-24 US disclosed
US-20100196825-A1 DEVELOPABLE BOTTOM ANTIREFLECTIVE COATING COMPOSITIONS ESPECIALLY SUITABLE FOR ION IMPLANT APPLICATIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-08-05 US disclosed
WO-2010086288-A1 DEVELOPABLE BOTTOM ANTIREFLECTIVE COATING COMPOSITIONS ESPECIALLY SUITABLE FOR ION IMPLANT APPLICATIONS AND METHOD OF FORMING A PATTERN USING IT INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-08-05 WO disclosed
US-20090098483-A1 POSITIVE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN TOKYO OHA KOGYO CO., LTD. (JP) 2009-04-16 US disclosed
US-20090035698-A1 POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD TOKYO OHKA KOGYO CO., LTD. (JP) 2009-02-05 US disclosed