SCHEMBL218662

SCHEMBL218662

Cc1cc(Cc2ccc(Cc3cc(C)c(O)c(C)c3)c(O)c2O)cc(C)c1O

nearest known ligand 0.55

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
SHBG P04278 1/20 0.55
PTGS1 P23219 3/20 0.47
PTGS2 P35354 3/20 0.47
HMGB1 P09429 1/20 0.47
CXCL12 P48061 1/20 0.47
ESR1 P03372 2/20 0.45
ESR2 Q92731 2/20 0.45
ALDH1A1 P00352 1/20 0.44
CA1 P00915 1/20 0.44
CA2 P00918 1/20 0.44
ALK Q9UM73 1/20 0.40
ALOX5 P09917 1/20 0.40
CALM1 P0DP23 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29831656 0.92 SHBG (0.48) SHBGPTGS1PTGS2HMGB1CXCL12
SCHEMBL771058 0.92 SHBG (0.48) SHBGPTGS1PTGS2HMGB1CXCL12
SCHEMBL17095067 0.87 SHBG (0.44) SHBGPTGS1PTGS2HMGB1CXCL12
SCHEMBL13609064 0.87 ALDH1A1 (0.52) SHBGPTGS1PTGS2HMGB1CXCL12
SCHEMBL686771 0.86 SHBG (0.55) SHBGPTGS1PTGS2HMGB1CXCL12
SCHEMBL4055787 0.86 SHBG (0.47) SHBGPTGS1PTGS2HMGB1CXCL12
SCHEMBL5406194 0.85 ALDH1A1 (0.56) SHBGPTGS1PTGS2HMGB1CXCL12
SCHEMBL3190810 0.84 SHBG (0.53) SHBGPTGS1PTGS2HMGB1CXCL12
SCHEMBL30375445 0.84 SHBG (0.53) SHBGPTGS1PTGS2HMGB1CXCL12
SCHEMBL28684704 0.84 SHBG (0.53) SHBGPTGS1PTGS2HMGB1CXCL12

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 102 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119875110-A Polyphenylene ether, polyphenylene ether solution, resin film, prepreg, and metal-clad laminate 旭化成株式会社 2025-04-25 CN claimed
US-12421349-B2 Polyphenylene ether composition ASAHI KASEI KABUSHIKI KAISHA (JP) 2025-09-23 US disclosed
CN-119875032-A Resin composition, resin film, prepreg, and metal-clad laminate 旭化成株式会社 2025-04-25 CN disclosed
CN-119875110-A Polyphenylene ether, polyphenylene ether solution, resin film, prepreg, and metal-clad laminate 旭化成株式会社 2025-04-25 CN disclosed
EP-4306571-B1 POLYPHENYLENE ETHER, METHOD FOR PRODUCING SAME, THERMALLY CURABLE COMPOSITION, PREPREG, AND MULTILAYER BODY ASAHI CHEMICAL IND (JP) 2024-12-25 EP disclosed
CN-114514261-B Polyphenylene ether composition 旭化成株式会社 2024-09-10 CN disclosed
CN-118496744-A Varnish and method for producing varnish 旭化成株式会社 2024-08-16 CN disclosed
US-20240166812-A1 POLYPHENYLENE ETHER, PRODUCTION METHOD OF THE SAME, THERMOSETTING COMPOSITION, PREPREG, AND LAMINATE ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-05-23 US disclosed
CN-113646052-B Reversible thermochromic composition, reversible thermochromic microcapsule pigment, and writing instrument 百乐墨水株式会社 2024-05-17 CN disclosed
CN-117777433-A Polyphenylene ether, process for producing the same, and thermosetting resin 中化学科学技术研究有限公司 2024-03-29 CN disclosed
US-20060204891-A1 Etching resistance; novolak resin having a fluorene or tetrahydrospirobiindene structure, an organic solvent, an acid generator, and a crosslinker, optionally combined with an intermediate layer having an antireflective effect SHIN-ETSU CHEMICAL CO., LTD. (JP) 2006-09-14 US disclosed
US-20060188809-A1 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2006-08-24 US disclosed
US-20060019195-A1 Photoresist undercoat-forming material and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2006-01-26 US disclosed
US-20060014106-A1 Photoresist undercoat-forming material and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2006-01-19 US disclosed
US-20050282091-A1 Patterning process and undercoat-forming material SHIN-ETSU CHEMICAL CO.,LTD. (JP) 2005-12-22 US disclosed
US-20050277756-A1 Porous film-forming composition, patterning process, and porous sacrificial film SHIN-ETSU CHEMICAL CO., LTD. 2005-12-15 US disclosed
US-20040259037-A1 Resist lower layer film material and method for forming a pattern SHIN-ETSU CHEMICAL CO., LTD. (JP) 2004-12-23 US disclosed
US-20040247900-A1 Antireflective film material, and antireflective film and pattern formation method using the same SHIN-ETSU CHEMICAL CO. LTD. (JP) 2004-12-09 US disclosed
US-20040241577-A1 Resist lower layer film material and method for forming a pattern SHIN-ETSU CHEMICAL CO., LTD. (JP) 2004-12-02 US disclosed
US-20040191479-A1 Anti-reflection film material and a substrate having an anti-reflection film and a method for forming a pattern SHIN-ETSU CHEMICAL CO., LTD. (JP) 2004-09-30 US disclosed