Predicted protein targets (top 19)
| gene | UniProt | supporting neighbours | confidence | |
|---|---|---|---|---|
| ▸ | SMN1; SMN2 | Q16637 | 2/20 | 0.44 |
| ▸ | TSHR | P16473 | 1/20 | 0.44 |
| ▸ | TTR | P02766 | 1/20 | 0.38 |
| ▸ | GPR3 | P46089 | 1/20 | 0.36 |
| ▸ | CHAT | P28329 | 1/20 | 0.35 |
| ▸ | SNCA | P37840 | 1/20 | 0.35 |
| ▸ | CYP2D6 | P10635 | 2/20 | 0.34 |
| ▸ | LDHA | P00338 | 1/20 | 0.34 |
| ▸ | POLB | P06746 | 1/20 | 0.34 |
| ▸ | MPL | P40238 | 2/20 | 0.34 |
| ▸ | ALDH1A1 | P00352 | 3/20 | 0.33 |
| ▸ | SLC22A6 | Q4U2R8 | 1/20 | 0.33 |
| ▸ | ALOX15 | P16050 | 1/20 | 0.33 |
| ▸ | CYP1A2 | P05177 | 1/20 | 0.33 |
| ▸ | COMT | P21964 | 1/20 | 0.32 |
| ▸ | AURKA | O14965 | 1/20 | 0.32 |
| ▸ | AURKB | Q96GD4 | 1/20 | 0.32 |
| ▸ | PADI4 | Q9UM07 | 1/20 | 0.32 |
| ▸ | LMNA | P02545 | 1/20 | 0.32 |
Click a target to see other patent compounds predicted against it — the reverse direction, in place.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL788508 | 0.73 | HSD11B1 (0.47) | GPR3POLBALDH1A1ALOX15LMNA | |
| SCHEMBL7116533 | 0.73 | MCL1 (0.51) | SMN1; SMN2GPR3POLBALDH1A1LMNA | |
| SCHEMBL309805 | 0.72 | TSHR (0.37) | SMN1; SMN2TSHRTTRCYP2D6MPL | |
| SCHEMBL14879315 | 0.70 | TSHR (0.50) | SMN1; SMN2TSHRTTRGPR3CYP2D6 | |
| Dibenzothiophene SCHEMBL29061713 | 0.70 | GPR3 (0.70) | SMN1; SMN2GPR3POLBALDH1A1ALOX15 | |
| SCHEMBL29409575 | 0.69 | TTR (0.61) | SMN1; SMN2TSHRTTRSNCALDHA | |
| SCHEMBL2524546 | 0.69 | TSHR (0.48) | SMN1; SMN2TSHRTTRCYP2D6LDHA | |
| SCHEMBL703189 | 0.69 | TTR (0.61) | SMN1; SMN2TSHRTTRSNCALDHA | |
| Sulfuric Acid SCHEMBL391429 | 0.67 | SMN1; SMN2 (0.46) | SMN1; SMN2TSHRTTRCHATSNCA | |
| SCHEMBL7710380 | 0.67 | TTR (0.59) | SMN1; SMN2TSHRTTRSNCALDHA |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 14 patents. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-11189430-B2 | Electrolytic capacitor and method for producing same | PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. (JP) | 2021-11-30 | — | — | US | disclosed |
| US-20200168404-A1 | ELECTROLYTIC CAPACITOR AND METHOD FOR PRODUCING SAME | PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. (JP) | 2020-05-28 | — | — | US | disclosed |
| US-20200082994-A1 | ELECTROLYTIC CAPACITOR AND METHOD FOR MANUFACTURING SAME | PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. (JP) | 2020-03-12 | — | — | US | disclosed |
| US-8674317-B2 | Sample surface inspection apparatus and method | EBARA CORPORATION (JP) | 2014-03-18 | — | — | US | disclosed |
| US-8673748-B2 | Method for fabricating semiconductor thin film using substrate irradiated with focused light, apparatus for fabricating semiconductor thin film using substrate irradiated with focused light, method for selectively growing semiconductor thin film using substrate irradiated with focused light, and semiconductor element using substrate irradiated with focused light | OSAKA UNIVERSITY (JP) | 2014-03-18 | — | — | US | disclosed |
| EP-2557416-A2 | Sample surface inspection apparatus and method | Ebara Corporation (JP) | 2013-02-13 | — | — | EP | disclosed |
| US-20120049063-A1 | SAMPLE SURFACE INSPECTION APPARATUS AND METHOD | EBARA CORPORATION (JP) | 2012-03-01 | — | — | US | disclosed |
| US-20120001302-A1 | METHOD FOR FABRICATING SEMICONDUCTOR THIN FILM USING SUBSTRATE IRRADIATED WITH FOCUSED LIGHT, APPARATUS FOR FABRICATING SEMICONDUCTOR THIN FILM USING SUBSTRATE IRRADIATED WITH FOCUSED LIGHT, METHOD FOR SELECTIVELY GROWING SEMICONDUCTOR THIN FILM USING SUBSTRATE IRRADIATED WITH FOCUSED LIGHT, AND SEMICONDUCTOR ELEMENT USING SUBSTRATE IRRADIATED WITH FOCUSED LIGHT | OSAKA UNIVERSITY (JP) | 2012-01-05 | — | — | US | disclosed |
| EP-1495312-A4 | SAMPLE SURFACE INSPECTION APPARATUS AND METHOD | EBARA CORP (JP) | 2008-12-17 | — | — | EP | disclosed |
| US-20080265159-A1 | Sample surface inspection apparatus and method | EBARA CORPORATION (JP) | 2008-10-30 | — | — | US | disclosed |
| US-7391036-B2 | Sample surface inspection apparatus and method | EBARA CORPORATION (JP) | 2008-06-24 | — | — | US | disclosed |
| US-20050158653-A1 | Sample surface inspection apparatus and method | EBARA CORPORATION (JP) | 2005-07-21 | — | — | US | disclosed |
| EP-1495312-A1 | SAMPLE SURFACE INSPECTION APPARATUS AND METHOD | Ebara Corporation (JP) | 2005-01-12 | — | — | EP | disclosed |
| WO-2003087797-A1 | SAMPLE SURFACE INSPECTION APPARATUS AND METHOD | EBARA CORPORATION (JP) | 2003-10-23 | — | — | WO | disclosed |