SCHEMBL25564307

SCHEMBL25564307

CC(=O)OC1(c2ccc(F)cc2)CCCCCC1

nearest known ligand 0.49

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
DRD2 P14416 3/20 0.49
DRD4 P21917 3/20 0.49
DRD3 P35462 3/20 0.49
HSD11B1 P28845 4/20 0.47
SLC6A3 Q01959 3/20 0.41
SLC6A4 P31645 2/20 0.41
SLC6A2 P23975 1/20 0.41
MAPT P10636 1/20 0.40
SMN1; SMN2 Q16637 1/20 0.40
ALDH1A1 P00352 2/20 0.37
HDAC3 O15379 1/20 0.37
HDAC1 Q13547 1/20 0.37
HDAC2 Q92769 1/20 0.37
HDAC6 Q9UBN7 1/20 0.37
OPRM1 P35372 1/20 0.37

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25564223 1.00 DRD2 (0.49) DRD2DRD4DRD3HSD11B1SLC6A3
SCHEMBL25564309 1.00 DRD2 (0.49) DRD2DRD4DRD3HSD11B1SLC6A3
SCHEMBL25564130 0.98 DRD2 (0.50) DRD2DRD4DRD3HSD11B1SLC6A3
SCHEMBL25564270 0.85 SLC6A3 (0.49) DRD2DRD4DRD3HSD11B1SLC6A3
SCHEMBL7915820 0.85 LMNA (0.40) DRD2DRD4DRD3MAPTSMN1; SMN2
SCHEMBL26059382 0.85 ESR2 (0.48) DRD2DRD4DRD3SLC6A3SLC6A4
SCHEMBL25564667 0.84 HSD11B1 (0.43) DRD2DRD4DRD3HSD11B1SLC6A3
SCHEMBL6036853 0.84 DRD2 (0.47) DRD2DRD4DRD3HSD11B1OPRM1
SCHEMBL25564232 0.83 HDAC3 (0.37) DRD2DRD4DRD3HSD11B1SLC6A3
SCHEMBL25564314 0.83 HDAC3 (0.37) DRD2DRD4DRD3HSD11B1SLC6A3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230367213-A1 MASK BLANK, RESIST PATTERN FORMING PROCESS AND CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-11-16 US disclosed
US-20230194986-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-22 US disclosed
US-20230161254-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-05-25 US disclosed