SCHEMBL2603147

SCHEMBL2603147

COCC(=O)OC1(C)C2CC3CC(C2)CC1C3

nearest known ligand 0.48

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
CYP17A1 P05093 2/20 0.48
CYP19A1 P11511 2/20 0.48
HSD11B1 P28845 3/20 0.34
MEN1 O00255 1/20 0.31
KMT2A Q03164 1/20 0.31
ALDH1A1 P00352 1/20 0.31
TSHR P16473 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12914637 0.94 CYP17A1 (0.44) CYP17A1CYP19A1HSD11B1
SCHEMBL12914640 0.86 CYP17A1 (0.41) CYP17A1CYP19A1ALDH1A1
SCHEMBL12914651 0.83 CYP17A1 (0.41) CYP17A1CYP19A1HSD11B1MEN1KMT2A
SCHEMBL17322536 0.81 CYP19A1 (0.50) CYP17A1CYP19A1HSD11B1
SCHEMBL119734 0.81 CYP19A1 (0.50) CYP17A1CYP19A1HSD11B1ALDH1A1
SCHEMBL210246 0.81 CYP19A1 (0.45) CYP17A1CYP19A1MEN1KMT2AALDH1A1
SCHEMBL949603 0.81 CYP17A1 (0.45) CYP17A1CYP19A1
SCHEMBL12914642 0.81 CYP17A1 (0.45) CYP17A1CYP19A1HSD11B1MEN1KMT2A
SCHEMBL854489 0.81 CYP17A1 (0.45) CYP17A1CYP19A1KMT2AALDH1A1
SCHEMBL2603148 0.81 HSD11B1 (0.33) CYP17A1CYP19A1HSD11B1MEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 16 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20200249573-A1 COMPOSITION FOR RESIST UNDERLAYER FILM FORMATION, UNDERLAYER FILM FOR LITHOGRAPHY, AND PATTERN FORMATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2020-08-06 US disclosed
US-9410016-B2 Aromatic polyacetals and articles comprising them DOW GLOBAL TECHNOLOGIES LLC (US) 2016-08-09 US disclosed
US-9290435-B2 Molecular glass of spirofluorene derivative, preparation method thereof and use thereof in photo-etching Technical Institute of Physics and Chemistry of the Chinese Academy of Sciences (CN) 2016-03-22 US disclosed
US-20150353468-A1 MOLECULAR GLASS OF SPIROFLUORENE DERIVATIVE, PREPARATION METHOD THEREOF AND USE THEREOF IN PHOTO-ETCHING Technical Institute of Physics and Chemistry of the Chinese Academy of Sciences (CN) 2015-12-10 US disclosed
US-20150031847-A1 METHOD OF FORMING POLYARYL POLYMERS DOW GLOBAL TECHNOLOGIES LLC 2015-01-29 US disclosed
US-20150025262-A1 BIS(ARYL)ACETAL COMPOUNDS U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2015-01-22 US disclosed
US-20150025278-A1 AROMATIC POLYACETALS AND ARTICLES COMPRISING THEM U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2015-01-22 US disclosed
US-8933239-B1 Bis(aryl)acetal compounds DOW GLOBAL TECHNOLOGIES LLC (US) 2015-01-13 US disclosed
US-8158329-B2 Compound and chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-04-17 US disclosed
US-20110008728-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2011-01-13 US disclosed
US-20110008728-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2011-01-13 US disclosed
US-20100266952-A1 CYCLIC COMPOUND, PHOTORESIST BASE, PHOTORESIST COMPOSITION, MICROFABRICATION PROCESS, AND SEMICONDUCTOR DEVICE IDEMITSU KOSAN CO., LTD. (JP) 2010-10-21 US disclosed
US-20100266952-A1 CYCLIC COMPOUND, PHOTORESIST BASE, PHOTORESIST COMPOSITION, MICROFABRICATION PROCESS, AND SEMICONDUCTOR DEVICE IDEMITSU KOSAN CO., LTD. (JP) 2010-10-21 US disclosed
US-20100190107-A1 CYCLIC COMPOUND, PHOTORESIST BASE MATERIAL AND PHOTORESIST COMPOSITION IDEMITSU KOSAN CO. LTD (JP) 2010-07-29 US disclosed
US-20100190107-A1 CYCLIC COMPOUND, PHOTORESIST BASE MATERIAL AND PHOTORESIST COMPOSITION IDEMITSU KOSAN CO. LTD (JP) 2010-07-29 US disclosed
US-20100151379-A1 COMPOUND AND CHEMICALLY AMPLIFIED RESIST COMPOSITION CONTAINING THE SAME SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-06-17 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (7 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20100151379-A1 COMPOUND AND CHEMICALLY AMPLIFIED RESIST COMPOSITION CONTAINING THE SAME C5, C1R, C9 CYP17A1 689/4885CYP19A1 85/4885HSD11B1 653/4885
US-20100190107-A1 CYCLIC COMPOUND, PHOTORESIST BASE MATERIAL AND PHOTORESIST COMPOSITION CRY1, PCNA, ERCC4 CYP17A1 1599/4885CYP19A1 803/4885HSD11B1 1416/4885
US-20150025262-A1 BIS(ARYL)ACETAL COMPOUNDS BOLA2; BOLA2B, TARS1, CBR1 CYP17A1 522/4885CYP19A1 132/4885HSD11B1 1357/4885
US-20150025278-A1 AROMATIC POLYACETALS AND ARTICLES COMPRISING THEM AR, PARP1, PARG CYP17A1 1735/4885CYP19A1 1240/4885HSD11B1 3768/4885
US-20200249573-A1 COMPOSITION FOR RESIST UNDERLAYER FILM FORMATION, UNDERLAYER FILM FOR LITHOGRAPHY, AND PATTERN FORMATION METHOD PRDM9, FBXL19, PRMT9 CYP17A1 3426/4885CYP19A1 3982/4885HSD11B1 4686/4885
US-20100266952-A1 CYCLIC COMPOUND, PHOTORESIST BASE, PHOTORESIST COMPOSITION, MICROFABRICATION PROCESS, AND SEMICONDUCTOR DEVICE C1S, CCNL2, CCNT1 CYP17A1 1685/4885CYP19A1 1050/4885HSD11B1 1239/4885
US-20150353468-A1 MOLECULAR GLASS OF SPIROFLUORENE DERIVATIVE, PREPARATION METHOD THEREOF AND USE THEREOF IN PHOTO-ETCHING PDGFRA, ARHGEF12, GLI2 CYP17A1 1167/4885CYP19A1 1533/4885HSD11B1 1295/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.