SCHEMBL2739909

SCHEMBL2739909

O=C(O)C1CC2CC1C1C3C=CC(C3)C21

nearest known ligand 0.34

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
POLB P06746 2/20 0.34
TDP1 Q9NUW8 2/20 0.34
APEX1 P27695 1/20 0.34
SMN1; SMN2 Q16637 1/20 0.33
L3MBTL1 Q9Y468 1/20 0.33
GABRR1 P24046 1/20 0.32
SLC1A2 P43004 1/20 0.31
SLC1A1 P43005 1/20 0.31
PKM P14618 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13390627 0.83
SCHEMBL13346515 0.83 RAB9A (0.31)
SCHEMBL13346517 0.79 CHRNB2 (0.33)
SCHEMBL22105343 0.79 HSD11B1 (0.35) TDP1
SCHEMBL7573428 0.79
SCHEMBL225707 0.79 CYP1A2 (0.33) SMN1; SMN2PKM
SCHEMBL30663529 0.79 MEN1 (0.30)
SCHEMBL14510434 0.76 SMN1; SMN2 (0.36) POLBSMN1; SMN2
SCHEMBL30663524 0.76
SCHEMBL14516600 0.76 HSD11B1 (0.37)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 159 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4737516-A1 RUBBER COMPOSITION FOR TIRES, AND TIRE BRIDGESTONE CORPORATION (JP) 2026-05-06 EP disclosed
EP-4737517-A1 RUBBER COMPOSITION FOR TIRE, AND TIRE BRIDGESTONE CORPORATION (JP) 2026-05-06 EP disclosed
EP-4737515-A1 RUBBER COMPOSITION FOR TIRES, AND TIRE BRIDGESTONE CORPORATION (JP) 2026-05-06 EP disclosed
EP-4703403-A1 CATALYST LIQUID AND METHOD FOR PRODUCING CATALYST LIQUID RIMTEC Corporation (JP) 2026-03-04 EP disclosed
EP-4703402-A1 POLYMERIZABLE COMPOSITION AND MOLDED ARTICLE RIMTEC Corporation (JP) 2026-03-04 EP disclosed
EP-4682199-A1 MEMBER, AND SEMICONDUCTOR MANUFACTURING?RELATED DEVICE Daikin Industries, Ltd. (JP) 2026-01-21 EP disclosed
EP-4678367-A1 METHOD FOR MANUFACTURING ALICYCLIC STRUCTURE-CONTAINING POLYMER RECYCLED PRODUCT Zeon Corporation (JP) 2026-01-14 EP disclosed
EP-4640736-A1 RING-OPENED COPOLYMER, RUBBER COMPOSITION, RUBBER CROSS-LINKED PRODUCT, AND TIRE Zeon Corporation (JP) 2025-10-29 EP disclosed
US-20250263511-A1 COPOLYMER FORMED BY RING-OPENING COPOLYMERIZATION OF CYCLOOLEFIN, PRODUCTION METHOD THEREFOR, RUBBER COMPOSITION, AND CROSSLINKED RUBBER OBJECT ZEON CORPORATION (JP) 2025-08-21 US disclosed
EP-3960414-B1 METHOD FOR PRODUCING CYCLOOLEFIN RESIN-DECORATIVE MOLDED ARTICLE RIMTEC CORP (JP) 2025-08-06 EP disclosed
US-20080003529-A1 (Meth)Acrylate, Polymer and Resist Composition MITSUBISHI RAYON CO., LTD. (JP) 2008-01-03 US disclosed
US-20080003529-A1 (Meth)Acrylate, Polymer and Resist Composition MITSUBISHI RAYON CO., LTD. (JP) 2008-01-03 US disclosed
US-20070248913-A1 PROCESS FOR PRODUCING FILM FORMING RESINS FOR PHOTORESIST COMPOSITIONS AZ ELECTRONIC MATERIALS USA CORP. 2007-10-25 US disclosed
US-20070248913-A1 PROCESS FOR PRODUCING FILM FORMING RESINS FOR PHOTORESIST COMPOSITIONS AZ ELECTRONIC MATERIALS USA CORP. 2007-10-25 US disclosed
US-20070148585-A1 Hyperbranched polymer, production method therefor and resist composition containing hyperbranched polymer LION CORPORATION. 2007-06-28 US disclosed
US-20070148585-A1 Hyperbranched polymer, production method therefor and resist composition containing hyperbranched polymer LION CORPORATION. 2007-06-28 US disclosed
US-7217495-B2 Fluorinated polymers, photoresists and processes for microlithography E I. DU PONT DE NEMOURS AND COMPANY (US) 2007-05-15 US disclosed
WO-2007007175-A2 PHOTOACTIVE COMPOUNDS AZ ELECTRONIC MATERIAL USA CORP. (DE) 2007-01-18 WO disclosed
US-20070015084-A1 Iodonium or sulfonium di-(tetrafluoroethyl sulfonate) ether acid generators; imaging negative and positive patterns in semiconductors and photoresists; microlithography; high photosensitivity MERCK PATENT GMBH (DE) 2007-01-18 US disclosed
US-20070015084-A1 Iodonium or sulfonium di-(tetrafluoroethyl sulfonate) ether acid generators; imaging negative and positive patterns in semiconductors and photoresists; microlithography; high photosensitivity MERCK PATENT GMBH (DE) 2007-01-18 US disclosed