SCHEMBL278558

SCHEMBL278558

Cc1cc(Cc2cc(C)c(O)c(Cc3ccc(O)cc3)c2C)c(C)c(Cc2ccc(O)cc2)c1O

nearest known ligand 0.44

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ESR1 P03372 4/20 0.43
ESR2 Q92731 3/20 0.43
THRA P10827 1/20 0.43
THRB P10828 1/20 0.43
KEAP1 Q14145 1/20 0.38
NPC1 O15118 1/20 0.37
RAB9A P51151 1/20 0.37
SHBG P04278 1/20 0.37
IDH1 O75874 2/20 0.36
SLC28A3 Q9HAS3 1/20 0.36
TMEM97 Q5BJF2 1/20 0.35
SIGMAR1 Q99720 1/20 0.35
PTGS1 P23219 1/20 0.35
PTGS2 P35354 1/20 0.35
KDM4E B2RXH2 1/20 0.35
GLA P06280 1/20 0.35
GAA P10253 1/20 0.35
HSD17B3 P37058 1/20 0.35
NPSR1 Q6W5P4 1/20 0.35
ERAP1 Q9NZ08 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30004194 1.00 ESR1 (0.43) ESR1ESR2THRATHRBKEAP1
SCHEMBL12808622 0.95 THRA (0.40) ESR1ESR2THRATHRBKEAP1
SCHEMBL22271537 0.94 KDM4E (0.43) ESR1ESR2THRATHRBKEAP1
SCHEMBL278497 0.92 AMY1A (0.45) ESR1ESR2THRATHRBKEAP1
SCHEMBL278508 0.91 AMY1A (0.44) ESR1ESR2THRATHRBKEAP1
SCHEMBL327957 0.89 AMY1A (0.45) ESR1ESR2THRATHRBKEAP1
SCHEMBL2788843 0.86 ESR1 (0.46) ESR1ESR2THRATHRBKEAP1
SCHEMBL2618671 0.84 SHBG (0.48) ESR1ESR2SHBGPTGS1PTGS2
SCHEMBL30003150 0.83 ESR1 (0.59) ESR1ESR2THRATHRBSHBG
SCHEMBL278559 0.83 ESR1 (0.59) ESR1ESR2THRATHRBSHBG

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 161 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2203783-A2 THICK FILM RESISTS AZ Electronic Materials USA Corp. (US) 2010-07-07 EP claimed
WO-2009040661-A2 THICK FILM RESISTS AZ ELECTRONIC MATERIALS USA CORP. (DE) 2009-04-02 WO claimed
US-20090081589-A1 THICK FILM RESISTS MERCK PATENT GMBH (DE) 2009-03-26 US claimed
EP-1623274-A2 PHOTORESIST COMPOSITIONS AZ Electronic Materials USA Corp. (US) 2006-02-08 EP claimed
US-6905809-B2 Photoresist compositions CLARIANT FINANCE (BVI) LIMITED (VG) 2005-06-14 US claimed
WO-2004088423-A2 PHOTORESIST COMPOSITIONS AZ ELECTRONIC MATERIALS USA CORP. (US) 2004-10-14 WO claimed
US-20040197696-A1 Photoresist compositions AZ ELECTRONIC MATERIALS USA CORP. 2004-10-07 US claimed
US-20040197704-A1 Photoresist compositions AZ ELECTRONIC MATERIALS USA CORP. 2004-10-07 US claimed
US-6790582-B1 NOVOLAK RESIN PARTIALLY ESTERIFIED WITH NAPHTHOQUINONEDIAZIDOSULFONYL GROUP; DILUTION RESIN(S), AND SOLVENT CLARIANT FINANCE BVI LIMITED (VG) 2004-09-14 US claimed
JP-9110761-A None JP disclosed
EP-3961676-B1 ETCHING METHOD AND PHOTOSENSITIVE RESIN COMPOSITION TOKYO OHKA KOGYO CO LTD (JP) 2025-01-22 EP disclosed
EP-4066059-B1 CHEMICALLY AMPLIFIED PHOTORESIST MERCK PATENT GMBH (DE) 2024-02-28 EP disclosed
US-11859100-B2 Surface coating compositions MERCK PATENT GMBH (DE) 2024-01-02 US disclosed
US-11859100-B2 Surface coating compositions MERCK PATENT GMBH (DE) 2024-01-02 US disclosed
US-5747218-A NAPHTHOQUINONEDIAZIDE SULFONIC ACID TETRAESTER OF POLYHYDROXYPOLYPHENOLS FUJI PHOTO FILM CO., LTD. (JP) 1998-05-05 US disclosed
US-5667932-A NAPHTHOQUINONEDIAZIDE SULFONIC ESTER OF POLYHYDROXY COMPOUND FUJI PHOTO FILM CO., LTD. (JP) 1997-09-16 US disclosed
JP-H09110761-A PRODUCTION OF TETRAPHENOL COMPOUND SUMITOMO CHEM CO LTD 1997-04-28 JP disclosed
EP-0744661-A1 Positive photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 1996-11-27 EP disclosed
EP-0740213-A2 Positive photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 1996-10-30 EP disclosed
EP-0695740-A1 Quinonediazine sulfonic acid esters and positive photoresist compositions comprising the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1996-02-07 EP disclosed