SCHEMBL28516574

SCHEMBL28516574

CC(C)C(=O)c1ccc(C(C)CO)cc1

nearest known ligand 0.46

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 1/20 0.46
DBH P09172 1/20 0.46
GAA P10253 1/20 0.46
RECQL P46063 1/20 0.46
ACE2 Q9BYF1 2/20 0.40
ABCB11 O95342 1/20 0.40
ACHE P22303 1/20 0.38
USP5 P45974 1/20 0.38
TRPA1 O75762 2/20 0.37
GRIA4 P48058 1/20 0.36
POLB P06746 1/20 0.36
CHRM2 P08172 1/20 0.36
ADRA2B P18089 1/20 0.36
DRD3 P35462 1/20 0.36
SIGMAR1 Q99720 1/20 0.36
HRH3 Q9Y5N1 1/20 0.36
CYP2C9 P11712 1/20 0.35
HDAC1 Q13547 1/20 0.35
HDAC8 Q9BY41 1/20 0.35
HDAC6 Q9UBN7 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13144198 0.84 ALDH1A1 (0.50) KDM4EDBHGAARECQLCYP2C9
SCHEMBL6675694 0.83 ALDH1A1 (0.44) ACE2ABCB11ACHEUSP5TRPA1
SCHEMBL548540 0.82 KMT2A (0.48) GAAABCB11POLB
SCHEMBL9988577 0.82 GRIA4 (0.51) ACE2USP5TRPA1GRIA4
SCHEMBL11134845 0.81 STAT3 (0.44) KDM4EDBHGAARECQLACHE
SCHEMBL5616922 0.80 PARP10 (0.48) RECQLABCB11ACHEPOLB
SCHEMBL10121174 0.80 KDM4E (0.62) KDM4EDBHGAARECQLADRA2B
SCHEMBL2641075 0.80 ABCB11 (0.52) ABCB11ACHETRPA1CYP2C9FFAR1
SCHEMBL195312 0.79 CYP2C9 (0.53) KDM4EDBHGAARECQLUSP5
SCHEMBL6452937 0.79 KDM4E (0.52) KDM4EDBHGAARECQLUSP5

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-107924123-B Material for lithography, method for producing same, composition for lithography, method for forming pattern, compound, resin, and method for purifying same 学校法人关西大学 2021-08-06 CN disclosed
CN-107428717-B Resist composition, resist pattern forming method, and polyphenol compound used for same 三菱瓦斯化学株式会社 2021-04-23 CN disclosed
CN-108008600-B Radiation-sensitive composition 三菱瓦斯化学株式会社 2021-02-09 CN disclosed