SCHEMBL3027574

SCHEMBL3027574

CCC(=CC1C2CC3CC(C2)CC1C3)C(=O)O

nearest known ligand 0.38

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
HSD11B1 P28845 1/20 0.38
L3MBTL1 Q9Y468 2/20 0.36
EPHX2 P34913 4/20 0.34
MAPT P10636 1/20 0.33
HSD17B10 Q99714 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16874413 0.86 L3MBTL1 (0.45) HSD11B1L3MBTL1EPHX2MAPT
SCHEMBL2173214 0.83 NPSR1 (0.41) HSD11B1L3MBTL1EPHX2
SCHEMBL18259758 0.79 L3MBTL1 (0.40) HSD11B1L3MBTL1EPHX2
SCHEMBL4400851 0.79 HSD11B1 (0.36) HSD11B1
SCHEMBL9649905 0.75 HSD11B1 (0.38) HSD11B1L3MBTL1EPHX2MAPTHSD17B10
SCHEMBL244479 0.75 HSD11B1 (0.38) HSD11B1L3MBTL1EPHX2MAPTHSD17B10
SCHEMBL245976 0.74 POLB (0.42) HSD11B1L3MBTL1EPHX2MAPT
SCHEMBL3023543 0.70 EPHX2 (0.36) HSD11B1EPHX2MAPT
SCHEMBL15534301 0.70 GRIK1 (0.46)
SCHEMBL15534303 0.70 GRIK1 (0.46)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 22 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-3067395-B1 ULTRAVIOLET RADIATION-CURABLE COMPOSITION, AND RECORDED MATTER SEIKO EPSON CORP (JP) 2020-10-28 EP claimed
EP-3067396-B1 ULTRAVIOLET CURABLE COMPOSITION AND RECORDED OBJECT SEIKO EPSON CORP (JP) 2019-04-17 EP claimed
EP-2738229-B1 Ultraviolet ray curable ink composition for use in ink jet method and printed object SEIKO EPSON CORP (JP) 2018-04-18 EP claimed
EP-2738228-B1 Ultraviolet ray curable ink composition for use in ink jet method and printed object SEIKO EPSON CORP (JP) 2018-01-17 EP claimed
EP-2871062-B1 Production method of recording material, and recording material SEIKO EPSON CORP (JP) 2016-08-17 EP claimed
EP-2738227-B1 Ultraviolet ray curable ink composition for use in ink jet method and printed object SEIKO EPSON CORP (JP) 2015-10-21 EP claimed
US-20100203446-A1 CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION AND METHOD FOR FORMING PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-08-12 US claimed
CN-117693545-A Organosilicon polymer compound and organosilicon polymer material 国立大学法人大阪大学 2024-03-12 CN disclosed
CN-117623918-A Preparation method of acrylic resin monomer for 193nm photoresist 河北凯力昂生物科技有限公司 2024-03-01 CN disclosed
US-9753299-B2 Optical element ASAHI GLASS COMPANY, LIMITED (JP) 2017-09-05 US disclosed
US-9654676-B2 Optical element, optical system and imaging apparatus ASAHI GLASS COMPANY, LIMITED (JP) 2017-05-16 US disclosed
US-20150309224-A1 OPTICAL DEVICE, OPTICAL SYSTEM, AND IMAGING APPARATUS ASAHI GLASS COMPANY, LIMITED (JP) 2015-10-29 US disclosed
US-20150281536-A1 OPTICAL ELEMENT, OPTICAL SYSTEM AND IMAGING APPARATUS ASAHI GLASS COMPANY, LIMITED (JP) 2015-10-01 US disclosed
US-20100203446-A1 CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION AND METHOD FOR FORMING PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-08-12 US disclosed
US-20060275697-A1 Top coating composition for photoresist and method of forming photoresist pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2006-12-07 US disclosed
EP-1558654-A4 NOVEL COPOLYMER, PHOTORESIST COMPOSITIONS THEREOF AND DEEP UV BILAYER SYSTEM THEREOF FUJIFILM ELECTRONIC MATERIALS (US) 2006-04-05 EP disclosed
EP-1558654-A2 NOVEL COPOLYMER, PHOTORESIST COMPOSITIONS THEREOF AND DEEP UV BILAYER SYSTEM THEREOF Fujifilm Electronic Materials USA, Inc. (US) 2005-08-03 EP disclosed
US-6916543-B2 Copolymer, photoresist compositions thereof and deep UV bilayer system thereof ARCH SPECIALTY CHEMICALS, INC. (US) 2005-07-12 US disclosed
US-20040137362-A1 Novel copolymer, photoresist compositions thereof and deep UV bilayer system thereof ARCH SPECIALTY CHEMICALS, INC. 2004-07-15 US disclosed
WO-2004040371-A2 NOVEL COPOLYMER AND PHOTORESIST COMPOSITIONS THEREOF ARCH SPECIALTY CHEMICALS, INC. (US) 2004-05-13 WO disclosed