SCHEMBL3098403

SCHEMBL3098403

COc1ccc(C[Si](OC)(OC)OC)cc1

nearest known ligand 0.52

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
IDO1 P14902 3/20 0.52
CA12 O43570 1/20 0.50
CA1 P00915 1/20 0.50
CA2 P00918 1/20 0.50
CA7 P43166 1/20 0.50
CA9 Q16790 1/20 0.50
CA14 Q9ULX7 1/20 0.50
AGXT P21549 2/20 0.48
LTA4H P09960 1/20 0.48
TAAR1 Q96RJ0 1/20 0.48
ALDH1A1 P00352 4/20 0.47
SMN1; SMN2 Q16637 3/20 0.47
ALOX15 P16050 2/20 0.47
TP53 P04637 1/20 0.47
CYP3A4 P08684 1/20 0.47
TSHR P16473 1/20 0.47
ALOX12 P18054 1/20 0.47
SLC6A4 P31645 1/20 0.45
CALM1 P0DP23 1/20 0.44
KDM4E B2RXH2 1/20 0.44

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL415828 0.88 ESR1 (0.39) IDO1CA2AGXTLTA4HTAAR1
SCHEMBL3162760 0.82 IDO1 (0.52) IDO1CA12CA1CA2CA7
SCHEMBL15805998 0.82 PLCG1 (0.52) ALDH1A1SMN1; SMN2TP53LMNA
SCHEMBL13027365 0.81 IDO1 (0.47) IDO1CA12CA1CA2CA7
SCHEMBL13027474 0.80 TAAR1 (0.57) IDO1CA12CA1CA2CA7
SCHEMBL13506625 0.79 SLC6A4 (0.48) IDO1CA12CA1CA2CA7
SCHEMBL3099254 0.79 LTA4H (0.52) LTA4HALDH1A1SMN1; SMN2TSHRKDM4E
SCHEMBL13790475 0.79 PPARA (0.36) IDO1AGXTLTA4HTAAR1ALDH1A1
SCHEMBL5574984 0.79 IDO1 (0.54) IDO1CA12CA1CA2CA7
SCHEMBL988626 0.79 AGXT (0.43) IDO1CA1CA2CA9AGXT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 239 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-108473684-B Process for producing siloxane polymer 东丽精细化工株式会社 2023-05-12 CN claimed
US-10647821-B2 Production process for silicone polymer TORAY FINE CHEMICALS CO., LTD. (JP) 2020-05-12 US claimed
US-20190023848-A1 PRODUCTION PROCESS FOR SILICONE POLYMER TORAY FINE CHEMICALS CO., LTD. (JP) 2019-01-24 US claimed
CN-108473684-A The manufacturing method of siloxane polymer 东丽精细化工株式会社 2018-08-31 CN claimed
EP-2628744-B1 Silicon-containing surface modifier, resist underlayer film composition containing this, and patterning process SHINETSU CHEMICAL CO (JP) 2016-11-30 EP claimed
EP-2628745-B1 Silicon-containing surface modifier, resist lower layer film-forming composition containing the same, and patterning process SHINETSU CHEMICAL CO (JP) 2015-03-25 EP claimed
US-20260118767-A1 REVERSE PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-04-30 US disclosed
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-02-12 US disclosed
EP-4692941-A2 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2026-02-11 EP disclosed
EP-4660703-A2 METAL-CONTAINING FILM PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2025-12-10 EP disclosed
US-20250372377-A1 METAL-CONTAINING FILM PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-12-04 US disclosed
US-20250348001-A1 METHOD FOR PRODUCING LAMINATE AND METHOD FOR PRODUCING SEMICONDUCTOR ELEMENT NISSAN CHEMICAL CORPORATION (JP) 2025-11-13 US disclosed
EP-4621486-A2 POLYVALENT AMMONIUM SALT COMPOUND, COMPOSITION FOR FORMING SILICON-CONTAINING RESIST UNDERLAYER FILM, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-09-24 EP disclosed
CN-102498440-A Silicon-containing composition having sulfonamide group for forming resist underlayer film NISSAN CHEMICAL IND LTD 2012-06-13 CN disclosed
US-20100285407-A1 Composition for forming a silicon-containing antireflection film, substrate having the silicon-containing antireflection film from the composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-11 US disclosed
US-20100233632-A1 SILICON-CONTAINING FILM-FORMING COMPOSITION, SILICON-CONTAINING FILM, AND PATTERN FORMING METHOD JSR CORPORATION (JP) 2010-09-16 US disclosed
US-20100178620-A1 INVERTED PATTERN FORMING METHOD AND RESIN COMPOSITION JSR CORPORATION (JP) 2010-07-15 US disclosed
US-7541134-B2 Antireflective film-forming composition, method for manufacturing the same, and antireflective film and pattern formation method using the same INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-06-02 US disclosed
US-20070134916-A1 Antireflection film composition, patterning process and substrate using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-06-14 US disclosed
US-5130461-A Silylation 1,3-(p-dimethoxybenzyl)-1,1,3,3-tetramethyl disiloxane with trimethylsilyl iodide followed by desilylation SHIN-ETSU CHEMICAL COMPANY LIMITED (JP) 1992-07-14 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20260118767-A1 REVERSE PATTERNING PROCESS EFNA1, EPHA4, ETV6 IDO1 3632/4885CA12 1528/4885CA1 1449/4885
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SMC1A, SPOUT1, LBR IDO1 1945/4885CA12 1973/4885CA1 964/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.