SCHEMBL3136680

SCHEMBL3136680

CSc1ccccc1CC(C)=O

nearest known ligand 0.48

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
LMNA P02545 2/20 0.48
L3MBTL1 Q9Y468 2/20 0.46
ALDH1A1 P00352 3/20 0.45
MAPT P10636 3/20 0.45
KMT2A Q03164 4/20 0.43
MEN1 O00255 3/20 0.43
CHRM2 P08172 1/20 0.43
HPGD P15428 2/20 0.40
GAA P10253 1/20 0.40
CYP2C9 P11712 1/20 0.40
CYP2C19 P33261 1/20 0.40
KDM4E B2RXH2 1/20 0.40
SLC6A2 P23975 1/20 0.39
SLC6A4 P31645 1/20 0.39
SLC6A3 Q01959 1/20 0.39
SMN1; SMN2 Q16637 1/20 0.38
IAPP P10997 1/20 0.38
MMP2 P08253 1/20 0.38
MMP9 P14780 1/20 0.38
MMP12 P39900 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Naphthalene SCHEMBL28357626 0.94 LMNA (0.44) LMNAL3MBTL1ALDH1A1MAPTKMT2A
Chlorobenzene SCHEMBL28322357 0.90 MAPT (0.43) LMNAL3MBTL1ALDH1A1MAPTKMT2A
Bromobenzene SCHEMBL28354245 0.90 L3MBTL1 (0.43) LMNAL3MBTL1ALDH1A1MAPTKMT2A
SCHEMBL1146046 0.84 CYP2C9 (0.56) LMNAL3MBTL1ALDH1A1MAPTKMT2A
SCHEMBL7495159 0.83 CHRM2 (0.46) LMNAL3MBTL1ALDH1A1MAPTKMT2A
SCHEMBL1569021 0.82 LMNA (0.47) LMNAL3MBTL1ALDH1A1MAPTKMT2A
SCHEMBL28549256 0.82 L3MBTL1 (0.45) LMNAL3MBTL1ALDH1A1MAPTKMT2A
SCHEMBL8697987 0.81 ALDH1A1 (0.51) LMNAL3MBTL1ALDH1A1MAPTKMT2A
SCHEMBL6805430 0.80 L3MBTL1 (0.57) LMNAL3MBTL1ALDH1A1MAPTGAA
SCHEMBL9430367 0.79 LMNA (0.51) LMNAL3MBTL1ALDH1A1MAPTKMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 22 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2025058368-A1 PHOTOSENSITIVE RESIN COMPOSITION, INSULATION FILM, AND SEMICONDUCTOR DEVICE 주식회사 엘지화학 2025-03-20 WO disclosed
CN-110903319-B Preparation method of 2-phosphonothioflavonoid compound 信阳农林学院 2022-06-14 CN disclosed
US-20220179316-A1 POLYIMIDE RESIN, POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, INSULATING FILM AND SEMICONDUCTOR DEVICE LG CHEM, LTD. (KR) 2022-06-09 US disclosed
CN-110903319-A Preparation method of 2-phosphonothioflavonoid compound 信阳农林学院 2020-03-24 CN disclosed
CN-106661031-B Pyrrolopyrimidine compounds or its salt, pharmaceutical composition and application containing it 大鹏药品工业株式会社 2019-07-23 CN disclosed
US-9766545-B2 Methods for small trench patterning using chemical amplified photoresist compositions TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2017-09-19 US disclosed
US-20150331324-A1 Methods for Small Trench Patterning Using Chemical Amplified Photoresist Compositions TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2015-11-19 US disclosed
US-9093276-B2 Methods for small trench patterning using chemical amplified photoresist compositions TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2015-07-28 US disclosed
US-20140065552-A1 Methods For Small Trench Patterning Using Chemical Amplified Photoresist Compositions TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2014-03-06 US disclosed
US-8592137-B2 Methods for small trench patterning using chemical amplified photoresist compositions TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2013-11-26 US disclosed
US-20100079547-A1 INKJET PRINTHEAD AND METHOD OF MANUFACTURING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2010-04-01 US disclosed
EP-1077391-B1 Onium salts, photoacid generators for resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2006-09-27 EP disclosed
US-6653044-B2 Addition copolymer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2003-11-25 US disclosed
US-6440634-B1 MICROFABRICATION OF INTEGRATED CIRCUITS, DEEP UV LITHOGRAPHY; PHENYLSULFONATE SALTS OF SULFONIUM OR IODINIUM CATIONS SHIN-ETSU CHEMICAL CO., LTD (JP) 2002-08-27 US disclosed
US-6416928-B1 HALOGENONIUM OR SULFONIUM SALTS OF SULFONATED DIPHENYLALKANE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-07-09 US disclosed
US-6395446-B1 CONTAINING SULFONYLDIAZOMETHANE COMPOUND AS ACID GENERATOR SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-05-28 US disclosed
US-6338931-B1 PHOTOACID GENERATOR OF SULFONYLDIAZOMETHANE COMPOUND SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-01-15 US disclosed
US-20010036593-A1 Chemical amplification type resist composition SHIN-ETSU CHEMICAL CO., LTD. 2001-11-01 US disclosed
EP-1117003-A1 Chemical amplification type resist composition Shin-Etsu Chemical Co., Ltd. (JP) 2001-07-18 EP disclosed
EP-1077391-A1 Onium salts, photoacid generators for resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-02-21 EP disclosed