SCHEMBL3482940

SCHEMBL3482940

CCCCC(CC)C(CC)O[SiH3]

nearest known ligand 0.33

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 3/20 0.33
TDP1 Q9NUW8 1/20 0.33
CA2 P00918 3/20 0.32
CA1 P00915 2/20 0.32
TSHR P16473 2/20 0.32
CYP3A4 P08684 2/20 0.32
SMN1; SMN2 Q16637 1/20 0.32
DNM1 Q05193 2/20 0.32
L3MBTL1 Q9Y468 1/20 0.31
MAPK1 P28482 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3482502 0.93 OPRM1 (0.34) DNM1
SCHEMBL702804 0.93 ALDH1A1 (0.34) ALDH1A1TDP1CA2CA1TSHR
SCHEMBL28663452 0.81 ALDH1A1 (0.36) ALDH1A1TDP1CA2CA1TSHR
SCHEMBL705015 0.81 DNM1 (0.35) ALDH1A1TDP1CA2CA1TSHR
SCHEMBL3710008 0.80
SCHEMBL26504465 0.79 CA2 (0.38) ALDH1A1TDP1CA2CA1TSHR
SCHEMBL3482265 0.78 LMNA (0.31)
SCHEMBL3482472 0.77 ALDH1A1 (0.33) ALDH1A1TDP1CA2CA1TSHR
SCHEMBL3481995 0.77 ALDH1A1 (0.33) ALDH1A1TDP1CA2CA1TSHR
SCHEMBL7536622 0.76 ALDH1A1 (0.36) ALDH1A1TDP1CA2CA1TSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2128897-B1 SILICON DIELECTRIC TREATING AGENT FOR USE AFTER ETCHING, PROCESS FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJITSU LTD (JP) 2015-05-06 EP disclosed
US-8716209-B2 Agent for post-etch treatment of silicon dielectric film, method of manufacturing semiconductor device, and semiconductor device FUJITSU LIMITED (JP) 2014-05-06 US disclosed
US-20100007031-A1 AGENT FOR POST-ETCH TREATMENT OF SILICON DIELECTRIC FILM, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJITSU LIMITED (JP) 2010-01-14 US disclosed
EP-2128897-A1 SILICON DIELECTRIC TREATING AGENT FOR USE AFTER ETCHING, PROCESS FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE Fujitsu Limited (JP) 2009-12-02 EP disclosed