SCHEMBL3758620

SCHEMBL3758620

COCN1CCN(O)C1=O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6754694 0.84 LMNA (0.31)
SCHEMBL7720084 0.80 ALDH1A1 (0.36)
SCHEMBL11647312 0.79 LMNA (0.30)
SCHEMBL6935640 0.77 PER2 (0.33)
SCHEMBL9972952 0.76 KMT2A (0.36)
SCHEMBL1196066 0.76
SCHEMBL2616354 0.76 PIK3CD (0.33)
SCHEMBL2159616 0.75 LMNA (0.30)
SCHEMBL27525130 0.75 PER2 (0.33)
SCHEMBL13292260 0.75 BRD4 (0.37)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7846646-B2 Resist pattern forming method, thin-film pattern forming method, and microdevice manufacturing method TDK CORPORATION (JP) 2010-12-07 US disclosed
US-20070248916-A1 Resist pattern forming method, thin-film pattern forming method, and microdevice manufacturing method TDK CORPORATION (JP) 2007-10-25 US disclosed
US-6593063-B1 Method of manufacturing a semiconductor device having an improved fine structure MITSUBISHI DENKI KABUSHIKI KAISHA (JP) 2003-07-15 US disclosed
US-6579657-B1 Material for forming a fine pattern and method for manufacturing a semiconductor device using the same MITSUBISHI DENKI KABUSHIKI KAISHA (JP) 2003-06-17 US disclosed
US-20020048631-A1 Method of frame plating and method of forming magnetic pole of thin- film magnetic head TDK CORPORATION (JP) 2002-04-25 US disclosed
US-6319853-B1 Method of manufacturing a semiconductor device using a minute resist pattern, and a semiconductor device manufactured thereby MITSUBISHI DENKI KABUSHIKI KAISHA (JP) 2001-11-20 US disclosed