SCHEMBL3908663

SCHEMBL3908663

C=C(C(=O)OC1(CC)C2CC3CC(C2)CC1C3)C(F)(F)F

nearest known ligand 0.33

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
TGM2 P21980 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14523968 0.90 TGM2 (0.30) TGM2
SCHEMBL5008366 0.88
SCHEMBL6103697 0.87 TGM2 (0.32) TGM2
SCHEMBL13922297 0.86
SCHEMBL19126193 0.86 CYP17A1 (0.30)
SCHEMBL14370455 0.84 EPHX2 (0.30)
SCHEMBL3977333 0.84 TGM2 (0.30) TGM2
SCHEMBL14523961 0.83 HSD11B1 (0.30)
SCHEMBL14523965 0.82 EPHX2 (0.34)
SCHEMBL14370451 0.81

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 24 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9395625-B2 Acrylic acid ester derivative and method for producing same, intermediate and method for producing same, high-molecular-weight compound, and photoresist composition KURARAY CO., LTD. (JP) 2016-07-19 US disclosed
US-9395625-B2 Acrylic acid ester derivative and method for producing same, intermediate and method for producing same, high-molecular-weight compound, and photoresist composition KURARAY CO., LTD. (JP) 2016-07-19 US disclosed
US-20150037733-A1 ACRYLIC ACID ESTER DERIVATIVE AND METHOD FOR PRODUCING SAME, INTERMEDIATE AND METHOD FOR PRODUCING SAME, HIGH-MOLECULAR-WEIGHT COMPOUND, AND PHOTORESIST COMPOSITION KURARAY CO., LTD. (JP) 2015-02-05 US disclosed
US-20150037733-A1 ACRYLIC ACID ESTER DERIVATIVE AND METHOD FOR PRODUCING SAME, INTERMEDIATE AND METHOD FOR PRODUCING SAME, HIGH-MOLECULAR-WEIGHT COMPOUND, AND PHOTORESIST COMPOSITION KURARAY CO., LTD. (JP) 2015-02-05 US disclosed
EP-2821403-A1 ACRYLIC ACID ESTER DERIVATIVE AND METHOD FOR PRODUCING SAME, INTERMEDIATE AND METHOD FOR PRODUCING SAME, HIGH-MOLECULAR-WEIGHT COMPOUND, AND PHOTORESIST COMPOSITION Kuraray Co., Ltd. (JP) 2015-01-07 EP disclosed
US-8030419-B2 Process for producing polymer for semiconductor lithography MARUZEN PETROCHEMICAL CO., LTD. (JP) 2011-10-04 US disclosed
US-8030419-B2 Process for producing polymer for semiconductor lithography MARUZEN PETROCHEMICAL CO., LTD. (JP) 2011-10-04 US disclosed
US-20100048848-A1 PROCESS FOR PRODUCING POLYMER FOR SEMICONDUCTOR LITHOGRAPHY MARUZEN PETROCHEMICAL CO., LTD. (JP) 2010-02-25 US disclosed
US-20100048848-A1 PROCESS FOR PRODUCING POLYMER FOR SEMICONDUCTOR LITHOGRAPHY MARUZEN PETROCHEMICAL CO., LTD. (JP) 2010-02-25 US disclosed
US-7494763-B2 Polyhydric phenol compound and chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-02-24 US disclosed
US-7202015-B2 Positive photoresist composition and pattern making method using the same FUJI PHOTO FILM CO., LTD. (JP) 2007-04-10 US disclosed
US-7195856-B2 Positive resist composition and pattern formation method using the same FUJIFILM CORPORATION (JP) 2007-03-27 US disclosed
US-7195856-B2 Positive resist composition and pattern formation method using the same FUJIFILM CORPORATION (JP) 2007-03-27 US disclosed
US-7147987-B2 Positive resist composition and pattern formation method using the same FUJI PHOTO FILM CO. LTD. (JP) 2006-12-12 US disclosed
US-20060058480-A1 Polymerizable monomer polymeric compound resin compositions for photoresist and method for producing semiconductor DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2006-03-16 US disclosed
US-20050282985-A1 FLUORINE-ATOM-CONTAINING POLYMERIZABLE UNSATURATED-MONOMER, FLUORINE-ATOM-CONTAINING POLYMERIC COMPOUND AND PHOTORESIST RESIN COMPOSITION DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2005-12-22 US disclosed
US-20050069808-A1 Positive resist composition and pattern formation method using the same FUJI PHOTO FILM CO., LTD. 2005-03-31 US disclosed
US-20050042543-A1 Positive photoresist composition and pattern making method using the same FUJI PHOTO FILM CO., LTD. 2005-02-24 US disclosed
EP-1508838-A2 Positive photoresist composition and pattern making method using the same Fuji Photo Film Co., Ltd. (JP) 2005-02-23 EP disclosed
EP-1505442-A1 Positive resist composition and pattern formation method using the same FUJI PHOTO FILM CO., LTD. (JP) 2005-02-09 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20050282985-A1 FLUORINE-ATOM-CONTAINING POLYMERIZABLE UNSATURATED-MONOMER, FLUORINE-ATOM-CONTAINING POLYMERIC COMPOUND AND PHOTORESIST RESIN COMPOSITION AFF1, AFF2, FPR1 TGM2 3671/4885
US-20150037733-A1 ACRYLIC ACID ESTER DERIVATIVE AND METHOD FOR PRODUCING SAME, INTERMEDIATE AND METHOD FOR PRODUCING SAME, HIGH-MOLECULAR-WEIGHT COMPOUND, AND PHOTORESIST COMPOSITION GFER, ASH2L, MLLT1 TGM2 2208/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.