SCHEMBL40512

SCHEMBL40512

C[C](C)C12CC3CC(CC(C3)C1)C2

nearest known ligand 0.48

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.42
SMN1; SMN2 Q16637 2/20 0.42
ALOX12 P18054 1/20 0.42
HSD11B1 P28845 4/20 0.40
GLA P06280 1/20 0.40
L3MBTL1 Q9Y468 1/20 0.39
GRIN2D O15399 3/20 0.39
GRIN3B O60391 3/20 0.39
GRIN1 Q05586 3/20 0.39
GRIN2A Q12879 3/20 0.39
GRIN2B Q13224 3/20 0.39
GRIN2C Q14957 3/20 0.39
GRIN3A Q8TCU5 3/20 0.39
SIGMAR1 Q99720 2/20 0.38
LMNA P02545 2/20 0.38
SLC22A2 O15244 2/20 0.38
SLC47A1 Q96FL8 2/20 0.38
SLC22A1 O15245 1/20 0.38
TSHR P16473 1/20 0.38
NFKB1 P19838 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL677939 0.81 ALDH1A1 (0.42) ALDH1A1SMN1; SMN2ALOX12HSD11B1GLA
SCHEMBL7457177 0.77 ALDH1A1 (0.39) ALDH1A1SMN1; SMN2ALOX12HSD11B1GLA
SCHEMBL6451090 0.77 ALDH1A1 (0.39) ALDH1A1SMN1; SMN2ALOX12HSD11B1GLA
SCHEMBL19757635 0.77 HSD11B1 (0.47) ALDH1A1HSD11B1GLAL3MBTL1LMNA
SCHEMBL159994 0.77 HSD11B1 (0.47) ALDH1A1HSD11B1GLAL3MBTL1LMNA
SCHEMBL678337 0.75 HSD11B1 (0.49) ALDH1A1SMN1; SMN2HSD11B1L3MBTL1TSHR
SCHEMBL8343395 0.73 ALDH1A1 (0.50) ALDH1A1SMN1; SMN2ALOX12HSD11B1GLA
SCHEMBL10424700 0.73 ALDH1A1 (0.50) ALDH1A1SMN1; SMN2ALOX12HSD11B1GLA
Acetic Acid SCHEMBL2777409 0.73 ALDH1A1 (0.49) ALDH1A1HSD11B1GLAL3MBTL1TSHR
SCHEMBL8073574 0.73 EPHX1 (0.44) ALDH1A1HSD11B1GLAL3MBTL1LMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 2489 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-3068405-B1 PYRROLO [1,2,F][1,2,4]TRIAZINES USEFUL FOR TREATING RESPIRATORY SYNCITIAL VIRUS INFECTIONS GILEAD SCIENCES INC (US) 2019-05-01 EP claimed
EP-3323414-A1 INHIBITORS OF NEDD8-ACTIVATING ENZYME Millennium Pharmaceuticals, Inc. (US) 2018-05-23 EP claimed
US-9840568-B2 Polymer and method for producing same MITSUBISHI CHEMICAL CORPORATION (JP) 2017-12-12 US claimed
US-9507259-B2 Photoresist composition ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2016-11-29 US claimed
US-9493469-B2 Piperidine inhibitors of Janus kinase 3 AUSPEX PHARMACEUTICALS, INC. (US) 2016-11-15 US claimed
EP-2202577-B1 Chemically amplified positive resist composition and resist patterning process SHINETSU CHEMICAL CO (JP) 2014-08-27 EP claimed
EP-2727915-A1 Synthesis of deuterated catechols and benzo[d][1,3]dioxoles and derivatives thereof Concert Pharmaceuticals Inc. (US) 2014-05-07 EP claimed
US-20130137038-A1 PHOTORESIST COMPOSITION DOW GLOBAL TECHNOLOGIES LLC (US) 2013-05-30 US claimed
EP-1078945-B1 Polymer for use in a photoresist composition SAMSUNG ELECTRONICS CO LTD (KR) 2011-10-12 EP claimed
US-7915404-B2 Methods for the preparation of pyrazole-containing compounds JANSSEN PHARMACEUTICA NV (BE) 2011-03-29 US claimed
US-20040033445-A1 Method of forming a photoresist pattern and method for patterning a layer using a photoresist SAMSUNG ELECTRONICS CO., LTD. (KR) 2004-02-19 US claimed
US-20040018442-A1 Resist composition comprising photosensitive polymer having lactone in its backbone YOON KWANG-SUB (KR) 2004-01-29 US claimed
US-6642336-B1 Ultraviolet radiation transparent; improved adhesion, contrast and dry etch resistance SAMSUNG ELECTRONICS CO., LTD. (KR) 2003-11-04 US claimed
US-20030180661-A1 Polymer having butadiene sulfone repeating unit and resist composition comprising the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2003-09-25 US claimed
US-6537727-B2 Improved dry etching resistance, adhesiveness to underlying material layers, line edge roughness of line patterns, contrast characteristics SAMSUNG ELECTRONICS CO., LTD. (KR) 2003-03-25 US claimed
US-20020160303-A1 Ether monomers and polymers having multi-ring structures, and photosensitive polymers and resist compositions obtained from the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2002-10-31 US claimed
US-20020155379-A1 Photosensitive monomer, photosensitive polymer and chemically amplified resist composition comprising lactone group having acid-labile protecting group SAMSUNG ELECTRONICS CO., LTD. (KR) 2002-10-24 US claimed
US-20020042016-A1 Resist composition comprising photosensitive polymer having loctone in its backbone SAMSUNG ELECTRONICS CO., LTD. (KR) 2002-04-11 US claimed
EP-1078945-A2 Polymer for use in a photoresist composition SAMSUNG ELECTRONICS CO. LTD. (KR) 2001-02-28 EP claimed
US-5837873-A PROTECTED OXYDIAMINES ABBOTT LABORATORIES (US) 1998-11-17 US claimed