SCHEMBL416279

SCHEMBL416279

c1ccc2c(C3c4c(ccc5ccccc45)Oc4ccc5ccccc5c43)cccc2c1

nearest known ligand 0.53

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
CYP1A2 P05177 2/20 0.53
CYP2C19 P33261 2/20 0.53
NPSR1 Q6W5P4 7/20 0.48
CFTR P13569 1/20 0.47
GOPC Q9HD26 1/20 0.47
KDM1A O60341 1/20 0.44
AVPR1B P47901 1/20 0.42
TAAR1 Q96RJ0 1/20 0.41
NPC1 O15118 1/20 0.41
ALDH1A1 P00352 1/20 0.41
POLB P06746 1/20 0.41
RAB9A P51151 1/20 0.41
CYP2D6 P10635 1/20 0.40
CYP2C9 P11712 1/20 0.40
HIF1A Q16665 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL22167524 0.92 CYP1A2 (0.49) CYP1A2CYP2C19NPSR1CFTRGOPC
SCHEMBL22167529 0.88 CYP1A2 (0.46) CYP1A2CYP2C19NPSR1CFTRGOPC
SCHEMBL21662347 0.88 MEN1 (0.45) CYP1A2CYP2C19NPSR1CFTRGOPC
SCHEMBL15998802 0.87 MEN1 (0.45) CYP1A2CYP2C19NPSR1CFTRGOPC
SCHEMBL22167532 0.87 NPSR1 (0.47) CYP1A2CYP2C19NPSR1CFTRGOPC
SCHEMBL416281 0.87 CYP1A2 (0.48) CYP1A2CYP2C19NPSR1CFTRGOPC
SCHEMBL28476451 0.85 CYP1A2 (0.49) CYP1A2CYP2C19NPSR1CFTRGOPC
SCHEMBL21971693 0.84 CYP1A2 (0.46) CYP1A2CYP2C19NPSR1CFTRGOPC
SCHEMBL22167533 0.83 NPSR1 (0.42) CYP1A2CYP2C19NPSR1CFTRGOPC
SCHEMBL28470279 0.82 ALDH1A1 (0.49) CYP1A2CYP2C19NPSR1CFTRGOPC

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 12 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9045587-B2 Naphthalene derivative, resist bottom layer material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-06-02 US disclosed
US-9045587-B2 Naphthalene derivative, resist bottom layer material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-06-02 US disclosed
US-20140363768-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-12-11 US disclosed
US-20140363768-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-12-11 US disclosed
US-8846846-B2 Naphthalene derivative, resist bottom layer material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-30 US disclosed
US-8846846-B2 Naphthalene derivative, resist bottom layer material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-30 US disclosed
US-8795955-B2 Naphthalene derivative, resist bottom layer material, resist bottom layer forming method, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-08-05 US disclosed
US-8795955-B2 Naphthalene derivative, resist bottom layer material, resist bottom layer forming method, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-08-05 US disclosed
US-20120064725-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-15 US disclosed
US-20120064725-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-15 US disclosed
US-20110311920-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, RESIST BOTTOM LAYER FORMING METHOD, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD (JP) 2011-12-22 US disclosed
US-20110311920-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, RESIST BOTTOM LAYER FORMING METHOD, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD (JP) 2011-12-22 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20110311920-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, RESIST BOTTOM LAYER FORMING METHOD, AND PATTERNING PROCESS SMC1A, VCAM1, APOB CYP1A2 649/4885CYP2C19 2115/4885NPSR1 2172/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.