SCHEMBL4535203

SCHEMBL4535203

O=S(=O)(OS(c1ccccc1)(c1ccccc1)c1ccccc1)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F

nearest known ligand 0.44

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
CA2 P00918 16/20 0.44
CA1 P00915 15/20 0.44
HSD11B1 P28845 1/20 0.37
NR1H2 P55055 2/20 0.37
NR1I2 O75469 1/20 0.36
NR1H3 Q13133 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL60438 1.00 CA2 (0.44) CA2CA1HSD11B1NR1H2NR1I2
SCHEMBL965542 1.00 CA2 (0.44) CA2CA1HSD11B1NR1H2NR1I2
SCHEMBL60138 1.00 CA2 (0.44) CA2CA1HSD11B1NR1H2NR1I2
SCHEMBL51400 0.98 CA1 (0.43) CA2CA1HSD11B1NR1H2NR1I2
SCHEMBL965951 0.93 CA1 (0.39) CA2CA1HSD11B1NR1H2NR1I2
SCHEMBL217002 0.93 HTR6 (0.38) CA2CA1HSD11B1NR1H2NR1H3
SCHEMBL3139139 0.93 CA1 (0.43) CA2CA1HSD11B1NR1H2NR1I2
SCHEMBL3139675 0.93 CA1 (0.43) CA2CA1HSD11B1NR1H2NR1I2
SCHEMBL3136124 0.93 CA1 (0.43) CA2CA1HSD11B1NR1H2NR1I2
SCHEMBL3130361 0.93 CA1 (0.43) CA2CA1HSD11B1NR1H2NR1I2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7504193-B2 Positive resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2009-03-17 US disclosed
US-7435527-B2 Mixture of acid generator and resin insoluble in alkaline developer and another acid decomposable compound FUJIFILM CORPORATION (JP) 2008-10-14 US disclosed
US-7157208-B2 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2007-01-02 US disclosed
EP-1637927-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2006-03-22 EP disclosed
US-20060046195-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. 2006-03-02 US disclosed
US-20050277060-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. 2005-12-15 US disclosed
US-20050186506-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. 2005-08-25 US disclosed
EP-1566694-A1 Positive resist composition and pattern forming method using the same Fuji Photo Film Co., Ltd. (JP) 2005-08-24 EP disclosed
US-20040253538-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2004-12-16 US disclosed