SCHEMBL51400

SCHEMBL51400

O=S(=O)(OS(c1ccccc1)(c1ccccc1)c1ccccc1)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F

nearest known ligand 0.43

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
CA1 P00915 13/20 0.43
CA2 P00918 13/20 0.43
HSD11B1 P28845 1/20 0.38
NR1H2 P55055 3/20 0.38
NR1I2 O75469 1/20 0.37
NR1H3 Q13133 3/20 0.36
MMP1 P03956 2/20 0.35
MMP2 P08253 2/20 0.35
MMP9 P14780 2/20 0.35
MMP8 P22894 2/20 0.35
MMP13 P45452 2/20 0.35
HTR6 P50406 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL60138 0.98 CA2 (0.44) CA1CA2HSD11B1NR1H2NR1I2
SCHEMBL60438 0.98 CA2 (0.44) CA1CA2HSD11B1NR1H2NR1I2
SCHEMBL965542 0.98 CA2 (0.44) CA1CA2HSD11B1NR1H2NR1I2
SCHEMBL4535203 0.98 CA2 (0.44) CA1CA2HSD11B1NR1H2NR1I2
SCHEMBL965951 0.95 CA1 (0.39) CA1CA2HSD11B1NR1H2NR1I2
SCHEMBL217002 0.95 HTR6 (0.38) CA1CA2HSD11B1NR1H2NR1H3
SCHEMBL3132394 0.92 CA1 (0.42) CA1CA2HSD11B1NR1H2NR1I2
SCHEMBL1804334 0.92 CA1 (0.42) CA1CA2HSD11B1NR1H2NR1I2
SCHEMBL2437767 0.91 HTR6 (0.38) CA1CA2HSD11B1NR1H2NR1H3
SCHEMBL3144262 0.91 HSD11B1 (0.42) CA1CA2HSD11B1NR1H2NR1I2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 4295 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12638775-B2 Methods and compositions for improved patterning of photoresist TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2026-05-26 US claimed
US-20260049180-A1 FAST CURING, STICKY POLYMERS FOR MEDICAL USES UNIV CALIFORNIA (US) 2026-02-19 US claimed
US-20250377591-A1 PHOTORESIST COMPOSITION AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE SAMSUNG ELECTRONICS CO LTD (KR) 2025-12-11 US claimed
CN-119978604-A Polymer film composition, polymer film, and laminate 福斯特(滁州)新材料有限公司 2025-05-13 CN claimed
CN-113296359-B Bottom layer composition and method for manufacturing semiconductor device 台湾积体电路制造股份有限公司 2025-05-02 CN claimed
US-12269925-B1 Fast curing, biocompatible and biodegradable adhesives and sealants THE REGENTS OF THE UNIVERSITY OF CALIFORNIA (US) 2025-04-08 US claimed
CN-119463075-A Poly (4-hydroxystyrene) -based block copolymer and preparation and application thereof 微芯新材料(湖州)有限公司 2025-02-18 CN claimed
US-20250021002-A1 BOTTOM ANTI-REFLECTIVE COATING FOR DEEP ULTRAVIOLET LITHOGRAPHY, PREPARATION METHOD THEREFOR AND USE THEREOF CHINA ADVANCED LITHOGRAPHIC MATERIAL TECHNOLOGY CO. LTD. (CN) 2025-01-16 US claimed
CN-111045296-B UV patternable polymer blend for organic thin film transistor 康宁股份有限公司 2024-12-27 CN claimed
CN-118684824-A Positive chemical amplification photoresist resin, preparation method and photoresist 万华化学集团股份有限公司 2024-09-24 CN claimed
US-20050145890-A1 Polymer sacrificial light absorbing structure and method GOODNER MICHAEL D (US) 2005-07-07 US claimed
US-20050147915-A1 Photoresist composition MERCK PATENT GMBH (DE) 2005-07-07 US claimed
US-6876017-B2 Polymer sacrificial light absorbing structure and method INTEL CORPORATION (US) 2005-04-05 US claimed
US-20040161710-A1 Pattern formation method MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 2004-08-19 US claimed
US-20040157415-A1 Polymer sacrificial light absorbing structure and method INTEL CORPORATION 2004-08-12 US claimed
US-20040009433-A1 Pattern formation method MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 2004-01-15 US claimed
EP-1311908-A2 PHOTORESIST COMPOSITION FOR DEEP UV AND PROCESS THEREOF CLARIANT INTERNATIONAL LTD. (CH) 2003-05-21 EP claimed
US-6447980-B1 POLY(MALEIC ANHYDRIDE-CO-T-BUTYL 5-NORBORNENE-2-CARBOXYLATE-CO-2-HYDROXYETHYL 5-NORBORNENE-2-CARBOXYLATE-CO-5-NORBORNENE-2-CARBOXYLIC ACID-CO-2-METHYL ADAMANTYL METHACRYLATE-CO-MEVALONIC LACTONE) AND ACID GENERATOR CLARIANT FINANCE (BVI) LIMITED (VG) 2002-09-10 US claimed
WO-2002006901-A2 PHOTORESIST COMPOSITION FOR DEEP UV AND PROCESS THEREOF CLARIANT INTERNATIONAL LTD (CH) 2002-01-24 WO claimed
US-6235446-B1 MIXTURE OF P-HYDROXYSTYRENE, ACRYLATED ESTER JSR CORPORATION (JP) 2001-05-22 US claimed