Propene

Propene

SCHEMBL4579715

C=CC.CCC(=O)OCCOC.CCOC(=O)C(C)O

nearest known ligand 0.35

Full drug profile on Sugi Atlas →

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
NAAA Q02083 1/20 0.35
ALDH1A1 P00352 3/20 0.34
CYP3A4 P08684 2/20 0.34
ALOX15 P16050 2/20 0.34
TSHR P16473 1/20 0.34
TDP1 Q9NUW8 1/20 0.34
GAA P10253 1/20 0.31
RAB9A P51151 1/20 0.31
CHRM1 P11229 1/20 0.31
ADORA1 P30542 1/20 0.31
HSD17B10 Q99714 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Propene SCHEMBL4579351 0.89 NAAA (0.36) NAAATSHR
Propene SCHEMBL4578199 0.86 ALDH1A1 (0.42) ALDH1A1CYP3A4ALOX15TSHRTDP1
Propene SCHEMBL143194 0.85 NAAA (0.45) NAAAALDH1A1TSHRGAARAB9A
Propene SCHEMBL6440361 0.84 TSHR (0.36) ALDH1A1TSHRTDP1HSD17B10
2-Methoxyethanol SCHEMBL3856721 0.83 TSHR (0.36) ALDH1A1CYP3A4ALOX15TSHRTDP1
Propene SCHEMBL28864444 0.82 ALDH1A1 (0.40) ALDH1A1ALOX15TSHRGAAHSD17B10
Propene SCHEMBL5145274 0.81 ALDH1A1 (0.38) ALDH1A1ALOX15TSHRHSD17B10
Propionic Acid SCHEMBL7662132 0.80 NAAA (0.41) NAAAALDH1A1TSHRGAAHSD17B10
2-Methoxyethanol SCHEMBL4579796 0.79 NAAA (0.40) NAAAALDH1A1TSHRGAAHSD17B10
Propene SCHEMBL181618 0.78 NAAA (0.52) NAAAALDH1A1CYP3A4TSHRGAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7425404-B2 Chemical amplification resist composition and pattern-forming method using the same FUJIFILM CORPORATION (JP) 2008-09-16 US disclosed
US-7291441-B2 Positive resist composition and pattern forming method utilizing the same FUJIFILM CORPORATION (JP) 2007-11-06 US disclosed
US-20060046190-A1 Positive resist composition and pattern forming method utilizing the same FUJI PHOTO FILM CO., LTD. 2006-03-02 US disclosed
US-20060040208-A1 Chemical amplification resist composition and pattern-forming method using the same FUJI PHOTO FILM CO., LTD. 2006-02-23 US disclosed