Fumaric Acid

Fumaric Acid

SCHEMBL4603810

C=C.C=C.C=COC=C.O=C(O)C=CC(=O)O

nearest known ligand 0.53

Full drug profile on Sugi Atlas →

Known targets — ChEMBL curated mechanism

ACEADRA1AADRA1BADRA1DADRA2AADRA2BADRA2CADRB1ADRB2ATP4AATP4BAXLBTKCACNA1CCACNA1DCACNA1FCACNA1SCCR5CHRM2CHRM3CPT1BCPT2DPP4DRD1DRD2EGFRERBB2ERBB4FLT3HRH1HRH3HTR1AHTR2AHTR2BHTR2CHTR4JAK1JAK2JAK3KCNH2KMT2AMAP2K1MAP2K2MEN1MLNRMPLMTORPPIK3CAPIK3CBPIK3CDPIK3CGPIK3R1PIK3R2PIK3R3PIK3R5PLK4PPARGRENS1PR1SLC6A2SLC6A3SLC6A4SMOTYK2atpAatpBatpCatpDatpEatpFatpFHatpGpol

The experimentally established mechanism targets of Fumaric Acid. The predicted profile below is derived independently by chemical similarity — agreement is a validation signal, a miss is honest.

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
MEN1 known ✓ O00255 1/20 0.31
KMT2A known ✓ Q03164 1/20 0.31
TSHR P16473 4/20 0.53
TP53 P04637 1/20 0.53
EGLN1 Q9GZT9 1/20 0.53
EGLN3 Q9H6Z9 1/20 0.53
LMNA P02545 2/20 0.42
HCAR2 Q8TDS4 8/20 0.42
ALDH1A1 P00352 3/20 0.32
TDP1 Q9NUW8 2/20 0.32
ALOX15 P16050 2/20 0.32
RECQL P46063 2/20 0.32
HSD17B10 Q99714 2/20 0.32
GAA P10253 1/20 0.32
GABRR1 P24046 2/20 0.32
GABRR2 P28476 2/20 0.32
BLM P54132 2/20 0.32
GABRR3 A8MPY1 1/20 0.32
APEX1 P27695 1/20 0.32
NPSR1 Q6W5P4 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Maleic Acid SCHEMBL4603806 1.00 TSHR (0.53) TSHRTP53EGLN1EGLN3LMNA
Fumaric Acid SCHEMBL5676045 1.00 TSHR (0.53) TSHRTP53EGLN1EGLN3LMNA
Maleic Acid SCHEMBL272884 0.97 TSHR (0.56) TSHRTP53EGLN1EGLN3LMNA
Fumaric Acid SCHEMBL2342320 0.97 TSHR (0.56) TSHRTP53EGLN1EGLN3LMNA
Fumaric Acid SCHEMBL4626269 0.97 TSHR (0.56) TSHRTP53EGLN1EGLN3LMNA
Maleic Acid SCHEMBL4626935 0.97 TSHR (0.56) TSHRTP53EGLN1EGLN3LMNA
Fumaric Acid SCHEMBL272885 0.97 TSHR (0.56) TSHRTP53EGLN1EGLN3LMNA
Vinyl Ether SCHEMBL9322572 0.85 HCAR2 (0.46) TSHRTP53EGLN1EGLN3LMNA
Vinyl Ether SCHEMBL27430610 0.83 HCAR2 (0.44) TSHRTP53EGLN1EGLN3LMNA
Vinyl Ether SCHEMBL8967458 0.83 HCAR2 (0.44) TSHRTP53EGLN1EGLN3LMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 56 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-108271380-B Antifouling composition 佐敦公司 2020-10-23 CN claimed
WO-2017009301-A1 ANTIFOULING COMPOSITION JOTUN A/S (NO) 2017-01-19 WO claimed
US-5364738-A Divinyl ethers, solubility in developers FUJI PHOTO FILM CO., LTD. (JP) 1994-11-15 US claimed
CN-108271380-B Antifouling composition 佐敦公司 2020-10-23 CN disclosed
WO-2017009301-A1 ANTIFOULING COMPOSITION JOTUN A/S (NO) 2017-01-19 WO disclosed
EP-2548739-A2 Lithographic printing plate precursor Fujifilm Corporation (JP) 2013-01-23 EP disclosed
EP-1673222-B1 PROCESS FOR PRODUCTION OF HEAT-SENSITIVE IMAGEABLE ELEMENTS KODAK GRAPHIC COMM GMBH (DE) 2008-07-09 EP disclosed
US-20070292809-A1 Process for the Production of Double-Layer Heat-Sensitive Imageable Elements KODAK POLYCHROME GRAPHICS, GMBH (DE) 2007-12-20 US disclosed
EP-1287985-B1 Lithographic printing plate precursor FUJI PHOTO FILM CO LTD (JP) 2006-10-11 EP disclosed
EP-1077391-B1 Onium salts, photoacid generators for resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2006-09-27 EP disclosed
EP-1673222-A1 PROCESS FOR PRODUCTION OF HEAT-SENSITIVE IMAGEABLE ELEMENTS Kodak Polychrome Graphics GmbH (DE) 2006-06-28 EP disclosed
US-6228559-B1 PHOTOSENSITVE LAYER ABD SILICONE RUBBER ON SUPPORT FUJI PHOTO FILM CO., LTD. (JP) 2001-05-08 US disclosed
EP-1077391-A1 Onium salts, photoacid generators for resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-02-21 EP disclosed
EP-1038890-A1 Dendritic polymers and their preparation SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-09-27 EP disclosed
EP-1039346-A1 Resist compositions and pattering process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-09-27 EP disclosed
EP-0908473-A1 Styrene polymers, chemically-amplified positive resist compositions, their preparation and use in a patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-04-14 EP disclosed
US-5658708-A RADIATION ABSORBING MATERIAL CONTAINING ENOL ETHER GROUPS FUJI PHOTO FILM CO., LTD. (JP) 1997-08-19 US disclosed
US-5637428-A POSITIVE WORKING PHOTOSENSITIVE COMPOSITION FUJI PHOTO FILM CO., LTD. (JP) 1997-06-10 US disclosed
US-5364738-A Divinyl ethers, solubility in developers FUJI PHOTO FILM CO., LTD. (JP) 1994-11-15 US disclosed
EP-0536690-A1 Light-sensitive composition FUJI PHOTO FILM CO., LTD. (JP) 1993-04-14 EP disclosed