SCHEMBL5404772

SCHEMBL5404772

O=S(=O)([O-])c1cc(C(F)(F)F)cc(C(F)(F)F)c1.c1ccc([I+]c2ccccc2)cc1

nearest known ligand 0.44

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
MAPT P10636 3/20 0.44
L3MBTL1 Q9Y468 1/20 0.43
PPARG P37231 1/20 0.38
CA1 P00915 2/20 0.37
CA2 P00918 2/20 0.37
MMP1 P03956 1/20 0.37
MMP2 P08253 1/20 0.37
MMP9 P14780 1/20 0.37
MMP8 P22894 1/20 0.37
MMP13 P45452 1/20 0.37
CYP19A1 P11511 1/20 0.37
ALDH1A1 P00352 3/20 0.36
PTPN1 P18031 1/20 0.36
P2RX1 P51575 1/20 0.36
TSHR P16473 1/20 0.36
HTT P42858 2/20 0.36
ACP1 P24666 1/20 0.36
PTPN7 P35236 1/20 0.36
PTPN12 Q05209 1/20 0.36
PTPN13 Q12923 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5403735 0.88 CA1 (0.49) CA1CA2MMP1MMP2MMP9
SCHEMBL503538 0.87 ALDH1A1 (0.43) MAPTCYP19A1ALDH1A1TSHRHTT
Toliodium SCHEMBL5401327 0.84 FFAR4 (0.43) MAPTCA1CA2ALDH1A1HTT
SCHEMBL5415916 0.83 ALDH1A1 (0.41) ALDH1A1TSHRHTTLMNAMEN1
SCHEMBL5410156 0.82 MAPT (0.46) MAPTL3MBTL1PPARGCA1CA2
SCHEMBL547560 0.82 HSD11B1 (0.44) CYP19A1ALDH1A1TSHRARMEN1
SCHEMBL5398351 0.81 CA2 (0.39) MAPTL3MBTL1CA2CYP19A1
SCHEMBL5408849 0.81 CNR2 (0.38) MAPTCA1CA2ALDH1A1KDM4E
SCHEMBL21522648 0.80 CES2 (0.46) MAPTL3MBTL1CA1CA2MMP1
SCHEMBL21522571 0.80 CES2 (0.46) MAPTL3MBTL1CA1CA2MMP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7312014-B2 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2007-12-25 US claimed
US-20040170918-A1 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2004-09-02 US claimed
EP-1406123-A1 RESIST COMPOSITIONS Wako Pure Chemical Industries, Ltd. (JP) 2004-04-07 EP claimed
US-7312014-B2 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2007-12-25 US disclosed
US-20040170918-A1 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2004-09-02 US disclosed
EP-1406123-A1 RESIST COMPOSITIONS Wako Pure Chemical Industries, Ltd. (JP) 2004-04-07 EP disclosed