SCHEMBL565171

SCHEMBL565171

COc1ccc(C[N+](C)(C)c2ccccc2)cc1

nearest known ligand 0.55

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
LTA4H P09960 2/20 0.55
ACHE P22303 4/20 0.47
CA4 P22748 1/20 0.46
SIGMAR1 Q99720 1/20 0.46
IDO1 P14902 2/20 0.44
HTT P42858 1/20 0.44
USP2 O75604 1/20 0.41
TP53 P04637 1/20 0.41
AGXT P21549 1/20 0.41
TRPA1 O75762 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2289588 0.98 LTA4H (0.58) LTA4HACHECA4SIGMAR1IDO1
Hydrochloric Acid SCHEMBL6277766 0.98 LTA4H (0.53) LTA4HACHECA4SIGMAR1IDO1
Fluoride Ion SCHEMBL4075058 0.96 LTA4H (0.52) LTA4HACHECA4SIGMAR1IDO1
SCHEMBL23069371 0.93 LTA4H (0.49) LTA4HACHECA4SIGMAR1IDO1
SCHEMBL21747569 0.93 LTA4H (0.49) LTA4HACHECA4SIGMAR1IDO1
SCHEMBL27121989 0.93 LTA4H (0.55) LTA4HACHECA4SIGMAR1HTT
SCHEMBL3384399 0.88 LTA4H (0.44) LTA4HACHECA4SIGMAR1HTT
SCHEMBL21747544 0.85 LTA4H (0.41) LTA4HACHECA4SIGMAR1IDO1
Trifluoromethanesulfonic Acid SCHEMBL565735 0.84 HTT (0.43) LTA4HACHEHTT
Trifluoromethanesulfonic Acid SCHEMBL1269460 0.84 ACHE (0.43) LTA4HACHEHTT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 67 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-103154081-B For the polymer composition of microelectronics assewbly part PROMERUS, LLC (US) 2015-11-25 CN claimed
EP-1917316-B1 COATING MASS ALTANA ELEC INSULATION GMBH (DE) 2010-12-01 EP claimed
EP-1497079-B1 COATED ABRASIVE ARTICLE, METHOD FOR MAKING THE SAME AND METHODS OF ABRADING A WORKPIECE 3M INNOVATIVE PROPERTIES CO (US) 2008-05-21 EP claimed
WO-2025107100-A1 EPOXY ADHESIVE INCLUDING POLYMERIC TOUGHENER AND CATIONIC PHOTOINITIATOR AND METHOD FOR USING SAME 3M INNOVATIVE PROPERTIES COMPANY (US) 2025-05-30 WO disclosed
WO-2025108217-A1 EPOXY ADHESIVE INCLUDING POLYMERIC TOUGHENER, CATIONIC PHOTOINITIATOR, AND THERMAL CATIONIC INITIATOR AND METHOD FOR USING SAME 3M INNOVATIVE PROPERTIES COMPANY (US) 2025-05-30 WO disclosed
WO-2025018368-A1 ADHESIVE COMPOSITION, ADHESIVE FILM FOR CIRCUIT CONNECTION, CONNECTED STRUCTURE, AND METHOD FOR PRODUCING CONNECTED STRUCTURE 株式会社レゾナック 2025-01-23 WO disclosed
WO-2025013728-A1 ADHESIVE BODY AND METHOD FOR PRODUCING SAME 株式会社レゾナック 2025-01-16 WO disclosed
WO-2025013726-A1 ADHESIVE COMPOSITION 株式会社レゾナック 2025-01-16 WO disclosed
CN-118742619-A Adhesive composition, adhesive film for circuit connection, and method for producing connection structure 株式会社力森诺科 2024-10-01 CN disclosed
CN-118525070-A Adhesive composition, adhesive film for circuit connection, and method for producing connection structure 株式会社力森诺科 2024-08-20 CN disclosed
WO-2024150766-A1 ADHESIVE COMPOSITION, ADHESIVE FILM FOR CIRCUIT CONNECTION, CONNECTION STRUCTURE, AND METHOD FOR PRODUCING CONNECTION STRUCTURE 株式会社レゾナック 2024-07-18 WO disclosed
US-7514202-B2 Thermal acid generator, resist undercoat material and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-04-07 US disclosed
WO-2008140846-A1 HIGH ETCH RESISTANT UNDERLAYER COMPOSITIONS FOR MULTILAYER LITHOGRAPHIC PROCESSES FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2008-11-20 WO disclosed
US-20080206667-A1 HIGH ETCH RESISTANT UNDERLAYER COMPOSITIONS FOR MULTILAYER LITHOGRAPHIC PROCESSES FUJIFILM ELECTRONIC MATERIALS, U.S.A., INC. 2008-08-28 US disclosed
US-20080206676-A1 THERMALLY CURED UNDERLAYER FOR LITHOGRAPHIC APPLICATION FUJIFILM ELECTRONIC MATERIALS, U.S.A, INC 2008-08-28 US disclosed
WO-2008103776-A2 THERMALLY CURED UNDERLAYER FOR LITHOGRAPHIC APPLICATION FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2008-08-28 WO disclosed
US-20080199814-A1 Device manufacturing process utilizing a double patterning process FUJIFILM ELECTRONIC MATERIALS, U.S.A., INC. 2008-08-21 US disclosed
WO-2008070060-A2 DEVICE MANUFACTURING PROCESS UTILIZING A DOUBLE PATTERING PROCESS FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2008-06-12 WO disclosed
US-20070264596-A1 Thermal acid generator, resist undercoat material and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-11-15 US disclosed
US-5066722-A Quaternary ammonium sulfonates, hydroxy containing resins, polesters, polylactones, epoxy resins, acrylic resins NIPPON PAINT CO., LTD. (JP) 1991-11-19 US disclosed