Trifluoromethanesulfonic Acid

Trifluoromethanesulfonic Acid

SCHEMBL565735

COc1ccc(C[N+](C)(C)c2ccccc2)cc1.O=S(=O)([O-])C(F)(F)F

nearest known ligand 0.43

Full drug profile on Sugi Atlas →

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
HTT P42858 1/20 0.43
KCNH2 Q12809 1/20 0.41
ALDH1A1 P00352 2/20 0.41
ACHE P22303 4/20 0.41
LTA4H P09960 1/20 0.41
EGFR P00533 1/20 0.40
ERBB2 P04626 1/20 0.40
KMT2A Q03164 2/20 0.40
POLB P06746 1/20 0.39
GAA P10253 2/20 0.38
PTGES O14684 1/20 0.38
TAS2R14 Q9NYV8 1/20 0.38
TAS2R8 Q9NYW2 1/20 0.38
CXCR3 P49682 1/20 0.38
TDP1 Q9NUW8 1/20 0.37

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Trifluoromethanesulfonic Acid SCHEMBL565741 0.95 ACHE (0.45) HTTKCNH2ALDH1A1ACHELTA4H
Trifluoromethanesulfonic Acid SCHEMBL1269460 0.90 ACHE (0.43) HTTACHELTA4HEGFRERBB2
Trifluoromethanesulfonic Acid SCHEMBL2334073 0.88 ALDH1A1 (0.45) HTTKCNH2ALDH1A1ACHEEGFR
Trifluoromethanesulfonic Acid SCHEMBL565680 0.87 GPR3 (0.40) KCNH2ALDH1A1ACHETDP1
SCHEMBL565099 0.87 HTT (0.37) HTTALDH1A1ACHELTA4HEGFR
Trifluoromethanesulfonic Acid SCHEMBL565684 0.85 GPR3 (0.41) KCNH2ACHETAS2R14
SCHEMBL565171 0.84 LTA4H (0.55) HTTACHELTA4H
Trifluoromethanesulfonic Acid SCHEMBL1455736 0.83 PKM (0.46) KCNH2ALDH1A1ACHEEGFRERBB2
SCHEMBL2289588 0.83 LTA4H (0.58) HTTALDH1A1ACHELTA4HTDP1
Hydrochloric Acid SCHEMBL6277766 0.83 LTA4H (0.53) HTTALDH1A1ACHELTA4HTDP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 39 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2022017815-A1 ROOM TEMPERATURE STABLE, ELECTRICALLY CONDUCTIVE 1K EPOXY FORMULATION HENKEL AG & CO. KGAA (DE) 2022-01-27 WO claimed
US-8729166-B2 Polymer composition for microelectronic assembly PROMERUS, LLC (US) 2014-05-20 US claimed
US-20140024750-A1 Polymer Composition for Microelectronic Assembly PROMERUS, LLC (US) 2014-01-23 US claimed
US-20120034387-A1 Polymer Composition for Microelectronic Assembly PROMERUS LLC (US) 2012-02-09 US claimed
US-20240427238-A1 RESIST UNDERLAYER FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2024-12-26 US disclosed
CN-118103775-A Composition for forming resist underlayer film 日产化学株式会社 2024-05-28 CN disclosed
WO-2023063148-A1 RESIST UNDERLAYER FILM-FORMING COMPOSITION 日産化学株式会社 2023-04-20 WO disclosed
EP-2384457-B1 COATING COMPOSITIONS MERCK PATENT GMBH (DE) 2022-07-06 EP disclosed
US-9146467-B2 Coating compositions MERCK PATENT GMBH (DE) 2015-09-29 US disclosed
US-9069245-B2 Near-infrared absorptive layer-forming composition and multilayer film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-06-30 US disclosed
EP-1788433-B1 Silicon-containing film forming composition and substrate processing method SHINETSU CHEMICAL CO (JP) 2014-07-09 EP disclosed
US-8729166-B2 Polymer composition for microelectronic assembly PROMERUS, LLC (US) 2014-05-20 US disclosed
EP-1788012-B1 Silicon-containing antireflective coating forming composition, silicon-containing antireflective coating, substrate processing intermediate, and substrate processing method SHINETSU CHEMICAL CO (JP) 2009-04-08 EP disclosed
US-20090087799-A1 ANTIREFLECTIVE COATING COMPOSITION, ANTIREFLECTIVE COATING, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-04-02 US disclosed
US-20070117044-A1 Silicon-containing film forming composition, silicon-containing film serving as etching mask, substrate processing intermediate, and substrate processing method SHIN-ETSU CHEMICAL CO., LTD. 2007-05-24 US disclosed
US-20070117252-A1 Silicon-containing antireflective coating forming composition, silicon-containing antireflective coating, substrate processing intermediate, and substrate processing method SHIN-ETSU CHEMICAL CO., LTD. 2007-05-24 US disclosed
EP-1788012-A1 Silicon-containing antireflective coating forming composition, silicon-containing antireflective coating, substrate processing intermediate, and substrate processing method Shin-Etsu Chemical Co., Ltd. (JP) 2007-05-23 EP disclosed
EP-1788433-A2 Silicon-containing film forming composition, silicon-containing film serving as etching mask, substrate processing intermediate, and substrate processing method Shin-Etsu Chemical Co., Ltd. (JP) 2007-05-23 EP disclosed
WO-2005097883-A2 METHOD OF PRODUCING A CROSSLINKED COATING IN THE MANUFACTURE OF INTEGRATED CIRCUITS KING INDUSTRIES, INC. (US) 2005-10-20 WO disclosed
US-20050215713-A1 Method of producing a crosslinked coating in the manufacture of integrated circuits KING INDUSTRIES, INC. 2005-09-29 US disclosed